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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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RC2012 датащи(PDF) 39 Page - Samsung semiconductor |
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RC2012 датащи(HTML) 39 Page - Samsung semiconductor |
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39 / 40 page  38 39 ISO / TS 16949 ISO 14001 OHSAS 18001 QC080000 2012 - 04 - 27 2009 - 04 - 28 02109E110143R2L CCCI 02109S10088R2L Date Validity Number Certification Section High Tech(China) Authority Date Validity Number Authority Date Validity Number Authority Date Validity Number Authority 2009 - 04- 28 2012 - 04 - 27 UL PRC-HSPM-1766 2010 - 07 - 27 2013 - 07 - 26 BSI CCCI TS 91430-008 2011 - 11 - 29 2014 - 11 - 28 Quality System Certification List Table 1:Certification list of Samsung Factory ISO/TS 16949 ISO 14001 OHSAS 18001 QC080000 Operation Notes Example of land Pattern Design Recommended Soldering Conditions General Structure General Precision Jumper Low ohms (RC Series) Low ohms (RUT Series) Ultra Low Ohms (RU Series) Ultra Low Ohms (RUK Series) Ultra Low Ohms (RUW Series) Arrays (CONVEX Type) Arrays (CONCAVE Type) Arrays (FLAT Type) Arrays for Memory Modules Attenuator Characteristics Performance Packaging Standard Resistance Value |
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