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QID3320002 датащи(PDF) 3 Page - Powerex Power Semiconductors |
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QID3320002 датащи(HTML) 3 Page - Powerex Power Semiconductors |
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3 / 6 page ![]() QID3320002 Dual IGBT HVIGBT Module 200 Amperes/3300 Volts 3 01/13 Rev. 8 Powerex, Inc., 173 Pavilion Lane,Youngwood, Pennsylvania 15697 (724) 925-7272 www.pwrx.com Electrical Characteristics, Tj = 25 °C unless otherwise specified Characteristics Symbol Test Conditions Min. Typ. Max. Units Input Capacitance Cies — 23 — nF Output Capacitance Coes VGE = 0V, VCE = 10V — 1.5 — nF Reverse Transfer Capacitance Cres — 0.7 — nF Turn-on Delay Time td(on) VCC = 1650V, IC = 200A, — 800 — ns Rise Time tr VGE = +15V/-8V, — 160 — ns Turn-off Delay Time td(off) RG(on) = 15Ω, RG(off) = 50Ω, — 3200 — ns Fall Time tf LS = 125nH, Inductive Load — 1300 — ns Turn-on Switching Energy Eon Tj = 125°C, IC = 200A, VGE = +15V/-8V, — 335 — mJ/P Turn-off Switching Energy Eoff RG(on) = 15Ω, RG(off) = 50Ω, — 275 — mJ/P VCC = 1650V, LS = 125nH, Inductive Load Diode Reverse Recovery Time** trr VCC = 1650V, IE = 200A, — 500 — ns Diode Reverse Recovery Charge** Qrr VGE = +15V/-8V, RG(on) = 15Ω, — 180* — µC Diode Reverse Recovery Energy Erec LS = 125nH, Inductive Load, Tj = 125°C — 190 — mJ/P Stray Inductance (C1-E2) LSCE — 60 — nH Lead Resistance Terminal-Chip RCE — 0.8 — mΩ Thermal and Mechanical Characteristics, Tj = 25 °C unless otherwise specified Characteristics Symbol Test Conditions Min. Typ. Max. Units Thermal Resistance, Junction to Case*** Rth(j-c) Q Per IGBT — 0.074 — °C/W Thermal Resistance, Junction to Case*** Rth(j-c) D Per FWDi — 0.11 — °C/W Contact Thermal Resistance, Case to Fin Rth(c-f) Per Module, — 0.018 — °C/W Thermal Grease Applied, λgrease = 1W/mK Comparative Tracking Index CTI 600 — — Clearance Distance in Air (Terminal to Base) da(t-b) 35.0 — — mm Creepage Distance Along Surface ds(t-b) 64 — — mm (Terminal to Base) Clearance Distance in Air da(t-t) 19 — — mm (Terminal to Terminal) Creepage Distance Along Surface ds(t-t) 54 — — mm (Terminal to Terminal) *Pulse width and repetition rate should be such that device junction temperature rise is negligible. **Represents characteristics of the anti-parallel, emitter-to-collector free-wheel diode (FWDi). ***TC measurement point is just under the chips. |
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