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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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STM8S003F3P6 датащи(PDF) 88 Page - STMicroelectronics |
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STM8S003F3P6 датащи(HTML) 88 Page - STMicroelectronics |
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88 / 100 page  (1) Data based on characterization results, not tested in production Static latch-up 9.3.11.6 Two complementary static tests are required on 10 parts to assess the latch-up performance: • A supply overvoltage (applied to each power supply pin) • A current injection (applied to each input, output and configurable I/O pin) are performed on each sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the application note AN1181. Table 50: Electrical sensitivities Class (1) Conditions Parameter Symbol A TA = 25 °C Static latch-up class LU A TA = 85 °C (1) Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC specifications, that means when a device belongs to class A it exceeds the JEDEC standard. B class strictly covers all the JEDEC criteria (international standard). DocID018576 Rev 3 88/100 STM8S003K3 STM8S003F3 Electrical characteristics |
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