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LP38798 датащи(PDF) 2 Page - Texas Instruments |
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LP38798 датащи(HTML) 2 Page - Texas Instruments |
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2 / 23 page ![]() IN EN CP GND(CP) OUT SET FB GND OUT OUT(FB) IN IN(CP) Exposed Pad on Bottom (DAP) 1 2 3 4 5 6 7 8 9 10 11 12 LP38798 SNOSCT6A – MARCH 2013 – REVISED MAY 2013 www.ti.com Connection Diagram Top View Connect WSON DAP to GND at Pins 6 and 7 Figure 1. LP38798SD-ADJ 12-Lead WSON Package (Top View) PIN DESCRIPTIONS Pin Name Function 1, 2 IN Device unregulated input voltage pins. Connect pins together at the package. 3 IN(CP) Charge pump input voltage pin. Connect directly to pins 1 and 2 at the package. Charge pump output. See Charge Pump section in the Applications Information 4 CP for more information. Enable pin. A Logic high level is required on this pin to enable the LDO output. A Logic low level will turn the output off and reduce the operating current of the 5 EN device. See Enable Input Operation section in the Applications Information for more information. 6 GND Device charge pump ground pin. 7 GND Device analog ground pin. 8 FB Feedback pin for programming the output voltage. Internally filtered pre-buffered output. A feedback resistor divider network from 9 SET this pin to FB and GND will set the output voltage of the device. 10 OUT(FB) OUT buffer feedback pin. Connect directly to pins 11 and 12 at the package. 11, 12 OUT Device regulated output voltage pins. Connect pins together at the package. The exposed die attach pad on the bottom of the package should be connected to a thermal pad at ground potential. See 12-Lead WSON Package Thermal Exposed Pad DAP Considerations section in the APPLICATIONS INFORMATION for more information. This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 2 Copyright © 2013, Texas Instruments Incorporated Product Folder Links: LP38798 |
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