ADG752 datasheet(2/8 Pages) AD

2 / 8 page

REV. 0

–2–

ADG752–SPECIFICATIONS (V

DD = +5 V

10%, GND = 0 V, unless otherwise noted.)

B Version

–40 C

Parameter

+25 C

to +85 C

Units

Test Conditions/Comments

ANALOG SWITCH

Analog Signal Range

0 V to VDD

On-Resistance (RON)15

Ω typ

VS = 0 V to VDD, IDS = 10 mA;

Ω max

Test Circuit 1

On-Resistance Match Between

0.1

Ω typ

VS = 0 V to VDD, IDS = 10 mA

Channels (

∆RON)

0.6

Ω max

On-Resistance Flatness (RFLAT(ON))2

Ω typ

VS = 0 V to 2.5 V, IDS = 10 mA

Ω max

VDD = + 4.5 V

LEAKAGE CURRENTS

Source OFF Leakage IS (OFF)

±0.01

nA typ

VD = 4.5 V/1 V, VS = 1 V/4.5 V;

±0.25

±3.0

nA max

Test Circuit 2

Channel ON Leakage ID, IS (ON)

±0.01

nA typ

VD = VS = 1 V, or 4.5 V;

±0.25

±3.0

nA max

Test Circuit 3

DIGITAL INPUTS

Input High Voltage, VINH

2.4

V min

Input Low Voltage, VINL

0.8

V max

Input Current

IINL or IINH

0.001

µA typ

VIN = VINL or VINH

±0.5

µA max

CIN, Digital Input Capacitance

pF typ

DYNAMIC CHARACTERISTICS1

tON

ns typ

RL = 300

Ω, C

L = 35 pF;

ns max

VS = 3 V, Test Circuit 4

tOFF

ns typ

RL = 300

Ω, C

L = 35 pF;

ns max

VS = 3 V, Test Circuit 4

Break-Before-Make Time Delay

ns typ

RL = 300 Ω, CL = 35 pF;

ns min

VS = 3 V, Test Circuit 5

Off Isolation

–80

dB typ

RL = 50 Ω, CL = 5 pF, f = 30 MHz;

Test Circuit 6

Crosstalk

–80

dB typ

RL = 50 Ω, CL = 5 pF, f = 30 MHz;

Test Circuit 7

–3 dB Bandwidth

250

MHz typ

RL = 50 Ω, CL = 5 pF, Test Circuit 8

CS (OFF)

pF typ

CD, CS (ON)

pF typ

POWER REQUIREMENTS

VDD = +5.5 V

IDD

0.001

µA typ

Digital Inputs = 0 V or +5.5 V

0.1

0.5

µA max

NOTES

1Guaranteed by design, not subject to production test.

Specifications subject to change without notice.

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