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ADM2682EBRIZ датащи(PDF) 17 Page - Analog Devices

номер детали ADM2682EBRIZ
подробное описание детали  5 kV rms Signal & Power Isolated RS-485 Transceiver with 짹15 kV ESD Protection
PDF  20 Pages
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производитель  AD [Analog Devices]
домашняя страница  http://www.analog.com
Logo AD - Analog Devices

ADM2682EBRIZ датащи(HTML) 17 Page - Analog Devices

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Preliminary Technical Data
ADM2682E/ADM2687E
Rev. PrE | Page 17 of 20
APPLICATIONS INFORMATION
PCB LAYOUT
The ADM2682E/ADM2687E isolated RS-422/RS-485 transceiver
contains an isoPower integrated dc-to-dc converter, requiring
no external interface circuitry for the logic interfaces. Power
supply bypassing is required at the input and output supply pins
(see Figure 35). The power supply section of the ADM2682E/
ADM2687E uses an 180 MHz oscillator frequency to pass power
efficiently through its chip-scale transformers. In addition, the
normal operation of the data section of the iCoupler introduces
switching transients on the power supply pins.
Bypass capacitors are required for several operating frequencies.
Noise suppression requires a low inductance, high frequency
capacitor, whereas ripple suppression and proper regulation
require a large value capacitor. These capacitors are connected
between Pin 1 (GND1) and Pin 2 (VCC) and Pin 7 (VCC) and
Pin 8 (GND1) for VCC. The VISOIN and VISOOUT capacitors are
connected between Pin 9 (GND2) and Pin 10 (VISOOUT) and
Pin 15 (VISOIN) and Pin 16 (GND2). To suppress noise and reduce
ripple, a parallel combination of at least two capacitors is required
with the smaller of the two capacitors located closest to the device.
The recommended capacitor values are 0.1 µF and 10 µF for
VISOOUT at Pin 9 and 10 and VCC at Pin 7 and 8. Capacitor values
of 0.01 µF and 0.1 µF are recommended for VISOIN at Pin 15 and
16 and VCC at Pin 1 and 2. The recommended best practice is to
use a very low inductance ceramic capacitor, or its equivalent,
for the smaller value capacitors. The total lead length between
both ends of the capacitor and the input power supply pin
should not exceed 10 mm.
Figure 35. Recommended PCB Layout
In applications involving high common-mode transients, ensure
that board coupling across the isolation barrier is minimized.
Furthermore, design the board layout such that any coupling
that does occur equally affects all pins on a given component
side. Failure to ensure this can cause voltage differentials between
pins exceeding the absolute maximum ratings for the device,
thereby leading to latch-up and/or permanent damage.
The ADM2682E/ADM2687E dissipate approximately 650 mW
of power when fully loaded. Because it is not possible to apply
a heat sink to an isolation device, the devices primarily depend
on heat dissipation into the PCB through the GND pins. If the
devices are used at high ambient temperatures, provide a thermal
path from the GND pins to the PCB ground plane. The board
layout in Figure 35 shows enlarged pads for Pin 1, Pin 8, Pin 9,
and Pin 16. Implement multiple vias from the pad to the ground
plane to reduce the temperature inside the chip significantly. The
dimensions of the expanded pads are at the discretion of the
designer and dependent on the available board space.
EMI CONSIDERATIONS
The dc-to-dc converter section of the ADM2682E/ADM2687E
components must, of necessity, operate at very high frequency
to allow efficient power transfer through the small transformers.
This creates high frequency currents that can propagate in circuit
board ground and power planes, causing edge and dipole radiation.
Grounded enclosures are recommended for applications that use
these devices. If grounded enclosures are not possible, good RF
design practices should be followed in the layout of the PCB.
See Application Note AN-0971, Control of Radiated Emissions
with isoPower Devices, for more information.
INSULATION LIFETIME
All insulation structures eventually break down when subjected to
voltage stress over a sufficiently long period. The rate of insulation
degradation is dependent on the characteristics of the voltage
waveform applied across the insulation. Analog Devices conducts
an extensive set of evaluations to determine the lifetime of the
insulation structure within the ADM2682E/ADM2687E.
Accelerated life testing is performed using voltage levels higher
than the rated continuous working voltage. Acceleration factors for
several operating conditions are determined, allowing calculation
of the time to failure at the working voltage of interest. The values
shown in Table 9 summarize the peak voltages for 50 years of
service life in several operating conditions. In many cases, the
working voltage approved by agency testing is higher than the
50-year service life voltage. Operation at working voltages higher
than the service life voltage listed leads to premature insulation
failure.
The insulation lifetime of the ADM2682E/ADM2687E depends
on the voltage waveform type imposed across the isolation barrier.
The iCoupler insulation structure degrades at different rates,
depending on whether the waveform is bipolar ac, unipolar ac,
or dc. Figure 36, Figure 37, and Figure 38 illustrate these different
isolation voltage waveforms.
Bipolar ac voltage is the most stringent environment. A 50-year
operating lifetime under the bipolar ac condition determines
the Analog Devices recommended maximum working voltage.
In the case of unipolar ac or dc voltage, the stress on the insulation
is significantly lower. This allows operation at higher working
voltages while still achieving a 50-year service life. The working
VCC
1
2
RxD
3
GND2
VISOIN
16
A
15
B
14
RE
4
13
DE
ADM2682E
ADM2687E
5
Z
12
TxD
6
11
VCC
7
Y
10
GND1
8
VISOOUT
9
GND2
GND1
100nF
100nF
100nF
10µF
10µF
100nF
10nF
10nF



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