©2011 Silicon Storage Technology, Inc.

S71296-05-000

02/11

24

8 Mbit SPI Serial Flash

SST25VF080B

Data Sheet

A Microchip Technology Company

Table 11:DC Operating Characteristics (SST25VF080B-80-xx-xxxx)

Symbol Parameter

Limits

Test Conditions

Min

Max

Units

Read Current

12

mA

Read Current

20

mA

Program and Erase Current

30

mA

Standby Current

20

µA

Input Leakage Current

1

µA

Output Leakage Current

1

µA

Input Low Voltage

0.8

V

Input High Voltage

Output Low Voltage

0.2

V

Output Low Voltage

0.4

V

Output High Voltage

V

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Table 12:Recommended System Power-up Timings

Symbol

Parameter

Minimum

Units

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

10

µs

TPU-WRITE1

10

µs

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Parameter

Description

Test Condition

Maximum

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

Output Pin Capacitance

12pF

Input Capacitance

6 pF

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Table 14:Reliability Characteristics

Symbol

Parameter

Minimum Specification

Units

Test Method

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

Endurance

10,000

Cycles

JEDEC Standard A117

Data Retention

100

Years

JEDEC Standard A103

Latch Up

mA

JEDEC Standard 78

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