33874 datasheet(23/38 Pages) FREESCALE

23 / 38 page

Analog Integrated Circuit Device Data

Freescale Semiconductor

33874

FUNCTIONAL DEVICE OPERATION

LOGIC COMMANDS AND REGISTERS

CDTOLR, DICR, UOVR, WDR, and NAR registers. (Refer to

the section entitled Serial Output Communication (Device

Status Return Data) beginning on page 24.)

ADDRESS 00001—OUTPUT CONTROL REGISTER

(OCR0)

The OCR0 register allows the MCU to control the ON/OFF

state of four outputs through the SPI. Incoming message bit

D3:D0 reflects the desired states of the four high side outputs

(INx_SPI), respectively. A logic [1] enables the

corresponding output switch and a logic [0] turns it OFF.

ADDRESS 01001—OUTPUT CONTROL REGISTER

(OCR1)

Incoming message bits D3:D0 reflect the desired output

that will be mirrored on the Current Sense (CSNS) pin. A

logic [1] on message bits D3:D0 enables the CSNS pin for

outputs HS3:HS0, respectively. In the event the current

sense is enabled for multiple outputs, the current will be

summed. In the event that bits D3:D0 are all logic [0], the

output CSNS will be tri-stated. This is useful when several

CSNS pins of several devices share the same A/D converter.

ADDRESS A1A0010—SELECT OVER-CURRENT

HIGH AND LOW REGISTER (SOCHLR_S)

The SOCHLR_s register allows the MCU to configure the

output over-current low and high detection levels,

respectively. Each output “s” is independently selected for

configuration based on the state of the D12:D11 bits

(Table 10).

Each output can be configured to different levels. In

addition to protecting the device, this slow blow fuse

emulation feature can be used to optimize the load

requirements matching system characteristics. Bits D2:D0

set the over-current low detection level to one of eight

possible levels, as shown in Table 11, page 23. Bit D3 sets

the over-current high detection level to one of two levels, as

outlined in Table 12, page 23.

ADDRESS A1A0011—CURRENT DETECTION TIME

AND OPEN LOAD REGISTER (CDTOLR)

The CDTOLR register is used by the MCU to determine

the amount of time the device will allow an over-current low

condition before an output latches OFF. Each output is

independently selected for configuration based on A1A0,

which are the state of the D12:D11 bits (refer to Table 10,

page 23).

Bits D1:D0 (OCLT1_s:OCLT0_s) allow the MCU to select

one of three over-current fault blanking times defined in

Table 13. Note that these timeouts apply only to the over-

current low detection levels. If the selected over-current high

level is reached, the device will latch off within 20

μs.

Table 10. Output Selection

A1 (D12)

A0 (D11)

HS_s

HS0

HS1

HS2

HS3

Table 11. Over-current Low Detection Levels

SOCL2_s

(D2)

SOCL1_s

(D1)

SOCL0_s

(D0)

Over-current Low

Detection (Amperes)

HS0 to HS3

8.9

7.9

7.0

5.8

4.8

3.9

2.8

* “_s” refers to the output, which is selected through bits D12:D11;

refer to Table 10, page 23.

Table 12. Over-current High Detection Levels

SOCH_s

* (D3)

Over-current High Detection (Amperes)

HS0 to HS3

* “_s” refers to the output, which is selected through bits D12:D11;

refer to Table 10, page 23.

Table 13. Over-current Low Detection Blanking Time

OCLT[1:0]_s

Timing

155ms

Do not use

75ms

150

μs

* “_s” refers to the output, which is selected through bits D12:D11;

refer to Table 10, page 23.

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