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450 датащи(PDF) 17 Page - Intel Corporation |
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450 датащи(HTML) 17 Page - Intel Corporation |
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17 / 100 page ![]() Datasheet 17 Electrical Specifications The TESTHI signals may use individual pull-up resistors or be grouped together as detailed below. A matched resistor must be used for each group: • TESTHI[1:0] • TESTHI[7:2] • TESTHI8/FC42 – cannot be grouped with other TESTHI signals • TESTHI9/FC43 – cannot be grouped with other TESTHI signals • TESTHI10 – cannot be grouped with other TESTHI signals • TESTHI11 – cannot be grouped with other TESTHI signals • TESTHI12/FC44 – cannot be grouped with other TESTHI signals • TESTHI13 – cannot be grouped with other TESTHI signals However, using boundary scan test will not be functional if these lands are connected together. For optimum noise margin, all pull-up resistor values used for TESTHI[13:0] lands should have a resistance value within ± 20% of the impedance of the board transmission line traces. For example, if the nominal trace impedance is 50 Ω, then a value between 40 Ω and 60 Ω should be used. 2.6 Voltage and Current Specification 2.6.1 Absolute Maximum and Minimum Ratings Table 4 specifies absolute maximum and minimum ratings only and lie outside the functional limits of the processor. Within functional operation limits, functionality and long-term reliability can be expected. At conditions outside functional operation condition limits, but within absolute maximum and minimum ratings, neither functionality nor long-term reliability can be expected. If a device is returned to conditions within functional operation limits after having been subjected to conditions outside these limits, but within the absolute maximum and minimum ratings, the device may be functional, but with its lifetime degraded depending on exposure to conditions exceeding the functional operation condition limits. At conditions exceeding absolute maximum and minimum ratings, neither functionality nor long-term reliability can be expected. Moreover, if a device is subjected to these conditions for any length of time then, when returned to conditions within the functional operating condition limits, it will either not function, or its reliability will be severely degraded. Although the processor contains protective circuitry to resist damage from static electric discharge, precautions should always be taken to avoid high static voltages or electric fields. |
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