WM8181

Advanced Information

WOLFSON MICROELECTRONICS LTD

AI Rev 3.0 January 2000

4

ELECTRICAL CHARACTERISTICS

TEST CHARACTERISTICS

°C, MCLK = 24MHz

unless otherwise stated.

PARAMETER

SYMBOL

TEST

CONDITIONS

MIN

TYP

MAX

UNIT

ANALOGUE SPECIFICATION

12-bit ADC including Sample and Hold. No Missing Codes Guaranteed.

Maximum sample rate

MCLK:VSMP ratio = 12:1

2

MSPS

Input signal voltage for

ADC full-scale (internal

reference control)

VINP-VINM

1.5

V

Input signal voltage for

ADC full-scale (external

reference control)

VINP-VINM

VREFIN

V

Input signal voltage for

ADC zero-scale (internal

reference control)

VINP-VINM

0

V

Input signal voltage for

ADC zero-scale (external

reference control)

VINP-VINM

0

V

Differential non-linearity

DNL

0.5

LSB

Integral non-linearity

INL

1.5

LSB

Analogue Inputs

Input voltage limits

VINP, VINM

0

AVDD

V

References: VRT, VRB

AVDD = 5V

2.85

V

VRT (internal reference control)

AVDD = 3.3V

1.70

V

AVDD = 5V

1.35

V

VRB (internal reference control)

AVDD = 3.3V

0.95

V

AVDD = 5V

2.10 +

VREFIN/2

V

VRT (external reference control)

AVDD = 3.3V

1.35 +

VREFIN/4

V

AVDD = 5V

2.10 -

VREFIN/2

VRB (external reference control)

AVDD = 3.3V

1.35 -

VREFIN/4

V

VRT, VRB output leakage

Power down

<1

µA

Clamp

VINM to VINP leakage

CLAMP low

<1

µA

VINM to VINP resistance

CLAMP high, AVDD = 3.3V

VINP = VINM = 2V

50

Ω

VINM to VINP resistance

CLAMP high, AVDD = 5V

VINP = VINM = 1.4V

30

Ω