Advanced Information

WM8181

WOLFSON MICROELECTRONICS LTD

AI Rev 3.0 January 2000

5

TEST CHARACTERISTICS

°C, MCLK = 24MHz

unless otherwise stated.

PARAMETER

SYMBOL

TEST

CONDITIONS

MIN

TYP

MAX

UNIT

DIGITAL SPECIFICATION

Digital Inputs

High level input voltage

0.8

∗ DVDD

V

Low level input voltage

0.2

∗ DVDD

V

High level input current

<1

µA

Low level input current

<1

µA

Input capacitance

5pF

Digital Outputs

High level output voltage

DVDD - 0.5

V

Low level output voltage

0.5

V

High impedance output current

<1

µA

OVERALL SYSTEM SPECIFICATION

Supply Currents

Total analogue supply current –

active

AVDD = DVDD = 5V

AVDD = DVDD = 3.3V

21

19

mA

mA

Total digital supply current –

active

AVDD = DVDD = 5V

AVDD = DVDD = 3.3V

2

1

mA

mA

Supply current – disabled

AVDD = DVDD = 5V

AVDD = DVDD = 3.3V

<1

<1

µA

µA

MCLK

VSMP

DOUT

t

MCLKH

t

MCLKL

t

PER

t

VSMPSU

t

VSMPH

SAMPLE n

t

PD

n-2 D[11]

n-2 D[10]

n-2 D[9]

Figure 1 Clock Inputs and Data Output

TEST CHARACTERISTICS

°C, MCLK = 24MHz

unless otherwise stated.

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Maximum MCLK period

41.7

ns

MCLK high

16

ns

MCLK low

16

ns

VSMP data set-up time

10

ns

VSMP data hold time

10

ns

MCLK to DOUT

propagation delay

AVDD = DVDD = 5V

10

ns

MCLK to DOUT

propagation delay

AVDD = DVDD = 3.3V

15

ns

Note: Parameters are measured at 50% of the rising/falling edge.