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H5GQ1H24AFR-R0C датащи(PDF) 170 Page - Hynix Semiconductor |
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H5GQ1H24AFR-R0C датащи(HTML) 170 Page - Hynix Semiconductor |
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170 / 173 page ![]() This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any responsability for use of circuits described. No patent licenses are implied. Rev. 1.0 /Nov. 2009 170 H5GQ1H24AFR Notes: 1. The parameter applies only when SEN is asserted. Figure. 89 Scan Capture Timing Scan Shift Time Scan clock to valid scan output tSAC ‐ 6ns 1 Scan clock to scan output hold tSOH 1.5 ‐ ns 1 Table 60. Scan AC Electrical Characteristics PARAMETER/CONDITION SYMBOL MIN MAX UNIT S NOTES SCK SEN tSDS tSDH Pins under Test VALID tSES SSH SOE# tSCS (Low) Not a true clock, but a single pulse or a series of pulses |
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