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ATmega165 датащи(PDF) 220 Page - ATMEL Corporation |
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ATmega165 датащи(HTML) 220 Page - ATMEL Corporation |
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220 / 336 page ![]() 220 ATmega165/V 2573G–AVR–07/09 Scanning the Analog Comparator The relevant Comparator signals regarding Boundary-scan are shown in Figure 105. The Boundary-scan cell from Figure 106 is attached to each of these signals. The sig- nals are described in Table 87. The Comparator need not be used for pure connectivity testing, since all analog inputs are shared with a digital port pin as well. Figure 105. Analog Comparator Figure 106. General Boundary-scan cell Used for Signals for Comparator and ADC ACBG BANDGAP REFERENCE ADC MULTIPLEXER OUTPUT ACME AC_IDLE ACO ADCEN ACD 0 1 DQ DQ G 0 1 From Previous Cell ClockDR UpdateDR ShiftDR To Next Cell EXTEST To Analog Circuitry/ To Digital Logic From Digital Logic/ From Analog Ciruitry |
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