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MCP3302 датащи(PDF) 6 Page - Microchip Technology |
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MCP3302 датащи(HTML) 6 Page - Microchip Technology |
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6 / 46 page ![]() MCP3302/04 DS21697E-page 6 © 2008 Microchip Technology Inc. 1.1 Test Circuits FIGURE 1-2: Load Circuit for TR, TF, TDO. FIGURE 1-3: Load circuit for TDIS and TEN. FIGURE 1-4: Power Supply Sensitivity Test Circuit (PSRR). FIGURE 1-5: Full Differential Test Configuration Example. FIGURE 1-6: Pseudo Differential Test Configuration Example. Test Point 1.4V DOUT 3kΩ CL = 100 pF *Waveform 1 is for an output with internal conditions such that the output is high, unless disabled by the output control. †Waveform 2 is for an output with internal conditions such that the output is low, unless disabled by the output control. Test Point DOUT 3kΩ 100 pF TDIS Waveform 2 TDIS Waveform 1 TEN Waveform VDD VDD/2 VSS VIH TDIS CS DOUT Waveform 1* DOUT Waveform 2† 90% 10% Voltage Waveforms for TDIS 2.63V - + 1k Ω 5V ±500 mVP-P 5VP-P 1k Ω 20 kΩ To VDD on DUT 1k Ω 1/2 MCP602 VDD = 5V 0.1 µF IN(+) IN(-) MCP330X 5VP-P VREF = 5V 5VP-P VCM = 2.5V 1µF 0.1 µF VREFVDD VSS 0.1µF IN(+) IN(-) MCP330X VDD = 5V VCM = 2.5V 5VP-P VREF = 2.5V 1µF 0.1µF VREFVDD VSS |
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