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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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ST72371 датащи(PDF) 88 Page - STMicroelectronics |
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ST72371 датащи(HTML) 88 Page - STMicroelectronics |
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88 / 94 page  88/94 ST72371/ST72372 7 GENERAL INFORMATION 7.1 EPROM ERASURE EPROM version devices are erased by exposure to high intensity UV light admitted through the transparent window. This exposure discharges the floating gate to its initial state through induced photo current. It is recommended that the EPROM devices be kept out of direct sunlight, since the UV content of sunlight can be sufficient to cause functional fail- ure. Extended exposure to room level fluorescent lighting may also cause erasure. An opaque coating (paint, tape, label, etc...) should be placed over the package window if the product is to be operated under these lighting con- ditions. Covering the window also reduces IDD in power-saving modes due to photo-diode leakage currents. An Ultraviolet source of wave length 2537 Å yield- ing a total integrated dosage of 15 Watt-sec/cm 2 is required to erase the device. It will be erased in 15 to 20 minutes if such a UV lamp with a 12mW/cm2 power rating is placed 1 inch from the device win- dow without any interposed filters. |
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