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USBUF02W6 датащи(PDF) 8 Page - STMicroelectronics |
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USBUF02W6 датащи(HTML) 8 Page - STMicroelectronics |
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8 / 9 page ![]() USBUFxxW6 8/9 Figure A13 shows the circuit used to perform measurements of the transition times. In Figure A14, we see the results of such measurements: trise = 3.8ns driver alone trise = 7.8ns with protection device The adding of the protection device causes the rise time increase of roughly 4ns. Note: Rise time has been measured between 10% and 90% of the signal (resp. 90% and 10%) D+ D- +5V +5V +5V 74HC04 +5V Square Pulse Generator 74HC04 USBUF -xxW6 VD+ Fig. A13: Typical rise and fall times: measure- ments configuration without with Fig. A14: Typical rise times with and without pro- tection device This low pass filter has been designed in order to meet the USB 1.1 standard requirements that implies the signal edges are maintained within the 4ns-20ns stipulated USB specification limits. To verify this point, we have measured the rise time of VD+ voltage (please refer to Fig. A13) with and without the USBUFxxW6 device. TRANSITION TIMES |
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