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Nichia STSE-CC2008A
<Cat.No.020719>
6.RELIABILITY
(1) TEST ITEMS AND RESULTS
Test Item
Standard
Test Method
Test Conditions
Note
Number of
Damaged
Resistance to
Soldering Heat
(Reflow Soldering)
JEITA ED-4701
300 301
Tsld=260°C, 10sec.
(Pre treatment 30°C,70%,168hrs.)
2 times
0/50
Solderability
(Reflow Soldering)
JEITA ED-4701
300 303
Tsld=215 ± 5°C,
3sec.
(Lead Solder)
1 time
over 95%
0/50
Thermal Shock
JEITA ED-4701
300 307
0°C ~ 100°C
15sec. 15sec.
20 cycles
0/50
Temperature Cycle
JEITA ED-4701
100 105
-40°C ~ 25°C ~ 100°C ~ 25°C
30min. 5min. 30min. 5min.
100 cycles
0/50
Moisture Resistance Cyclic
JEITA ED-4701
200 203
25°C ~ 65°C ~ -10°C
90%RH 24hrs./1cycle
10 cycles
0/50
High Temperature Storage
JEITA ED-4701
200 201
Ta=100°C
1000 hrs.
0/50
Temperature Humidity
Storage
JEITA ED-4701
100 103
Ta=60°C, RH=90%
1000 hrs.
0/50
Low Temperature Storage
JEITA ED-4701
200 202
Ta=-40°C
1000 hrs.
0/50
Steady State Operating Life
Ta=25°C, IF=20mA
1000 hrs.
0/50
Steady State Operating Life
of High Temperature
Ta=85°C, IF=5mA
1000 hrs.
0/50
Steady State Operating Life
of High Humidity Heat
60°C, RH=90%, IF=15mA
500 hrs.
0/50
Steady State Operating Life
of Low Temperature
Ta=-30°C, IF=20mA
1000 hrs.
0/50
Vibration
JEITA ED-4701
400 403
100 ~ 2000 ~ 100Hz Sweep 4min.
200m/s2
3direction, 4cycles
48min.
0/50
Substrate Bending
JEITA ED-4702
3mm, 5 ± 1 sec.
1 time
0/50
Stick
JEITA ED-4702
5N,
10 ± 1 sec.
1 time
0/50
(2) CRITERIA FOR JUDGING THE DAMAGE
Criteria for Judgement
Item
Symbol
Test Conditions
Min.
Max.
Forward Voltage
VF
IF=20mA
-
U.S.L.*)# 1.1
Reverse Current
IR
VR=5V
-
U.S.L.*)# 2.0
Luminous Intensity
IV
IF=20mA
L.S.L.**)# 0.7
-
*) U.S.L. : Upper Standard Level
**) L.S.L. : Lower Standard Level
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