MIL-PRF-19500/376E

14

TABLE I. Group A inspection - Continued.

MIL-STD-750

Limit

Inspection 1/

Method

Conditions

Symbol

Min

Max

Unit

Subgroup 4 - continued.

Small-signal short- circuit

forward current transfer ratio

3206

f = 1 kHz

250

900

Open circuit output

capacitance

3236

100 kHz

≤ f ≤ 1 MHz

5.0

pF

Input capacitance (output

open-circuited)

3240

100 kHz

≤ f ≤ 1 MHz

6.0

pF

Noise figure

3246

µA dc; R

Ω;

NF1

7.5

dB

Noise figure

3246

µA dc; R

Ω;

NF2

3

dB

Noise figure

3246

µA dc; R

Ω;

NF3

2

dB

Noise figure (wideband)

3246

Noise bandwidth = 10 Hz to 15.7

µA dc;

Ω;

NF4

3

dB

Subgroups 5 and 6

Not applicable

Subgroup 7 4/

Decap internal visual (design

verification)

2075

n = 1 device, c = 0

1/ For sampling plan see MIL-PRF-19500.

2/ For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A

failure in group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun

upon submission.

3/ Separate samples may be used.

4/ Not required for JANS devices.

5/ Not required for laser marked devices.