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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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M68AW512 датащи(PDF) 14 Page - STMicroelectronics |
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M68AW512 датащи(HTML) 14 Page - STMicroelectronics |
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14 / 18 page  M68AW512D 14/18 Figure 13. E1 Controlled, Low VCC Data Retention AC Waveforms Figure 14. E2 Controlled, Low VCC Data Retention AC Waveforms Table 9. Low VCC Data Retention Characteristics Note: 1. All other Inputs at VIH ≥ VCC –0.2V or VIL ≤ 0.2V. 2. Tested initially and after any design or process that may affect these parameters. tAVAV is Read cycle time. 3. No input may exceed VCC +0.2V. Symbol Parameter Test Condition Min Typ Max Unit ICCDR (1) Supply Current (Data Retention) VCC = 1.5V, E1 ≥ VCC –0.2V or E2 ≤ 0.2V or UB = LB ≥ VCC –0.2V, f = 0 510 µA tCDR (1,2) Chip Deselected to Data Retention Time 0ns tR (2) Operation Recovery Time tAVAV ns VDR (1) Supply Voltage (Data Retention) E1 ≥ VCC –0.2V or E2 ≤ 0.2V or UB = LB ≥ VCC –0.2V, f = 0 1.5 V AI05985 DATA RETENTION MODE tR 3.6V tCDR VCC 2.7V VDR > 1.5V E1 or UB/LB E1 ≥ VDR – 0.2V or UB = LB ≥ VDR – 0.2V AI05986B DATA RETENTION MODE tR 3.6V tCDR VCC 2.7V VDR > 1.5V E2 E2 < 0.2V |
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