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STP25N018M9 датащи(PDF) 4 Page - STMicroelectronics |
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STP25N018M9 датащи(HTML) 4 Page - STMicroelectronics |
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4 / 12 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD(1) Source-drain current - 56 A ISDM(2) Source-drain current (pulsed) - 375 A VSD(3) Forward on voltage ISD = 55 A, VGS = 0 V - 1.6 V trr Reverse recovery time ISD = 55 A, di/dt = 100 A/µs, VDD = 100 V (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 151 ns Qrr Reverse recovery charge - 0.9 µC IRRM Reverse recovery current - 12 A trr Reverse recovery time ISD = 55 A, di/dt = 100 A/µs, VDD = 100 V, TJ = 150 °C (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 213 ns Qrr Reverse recovery charge - 1.9 µC IRRM Reverse recovery current - 17.5 A 1. Limited by package. 2. Pulse width is limited by safe operating area. 3. Pulsed: pulse duration = 300 µs, duty cycle 1.5%. STP25N018M9 Electrical characteristics DS14761 - Rev 2 page 4/12 |
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