* LabView and LabWindows are trademarks of National Instruments

Keysight VEE is a trademark of Keysight Technologies. Windows is a

trademark of Microsoft.

** GPIB optional

DATA STORAGE

A convenient front mounted flash drive port

allows configurations, results and screen shots

to be directly extracted from the instrument for

further analysis. The direct upload of complex

test configurations enables simplification

of the of the most advanced test scenarios.

Measurement data can be automatically

recorded to the flash drive on completion of a

test run – thus allowing for virtually unlimited

measurement data storage.

ADVANCED SEQUENCING MODE

Sequence mode is an advanced sequencing

feature for creating and performing complex

test routines. Stored test configuration setups

can be imported into up to 25 individual

steps inside one test routine, allowing

complete synchronisation of the instrument

via advanced triggering capabilities and

features. Synchronisation of two instruments

or additional test equipment can be achieved

through the use of the DIO port under the

control of the sequence mode engine.

SIMPLIFY

TEST SETUPS

**

SCPI COMPATIBLE

The SMU can be integrated into existing

systems using the universal SCPI command

set. An extensive library of commands can

be used to simplify setups and automate

systems, increasing productivity and

reducing costs.

LABVIEW & IVI DRIVER

An IVI-COM/IVI-C driver for Windows

is included. This provides support for

common high-level applications such as

LabView*, LabWindows*, and Keysight

VEE*.

ACCESSORIES

This instrument can be rack mounted, a

suitable 2U 19” rack kit is available from

the manufacturers or their overseas

agents. Contact TTi for test fixture

requirements.

TRIGGER

DELAY

DIO OUT

RUN

STORED

TEST

SETUP

CONDITION

CONDITION

CONDITION

ACTION

REPEAT

NEXT

STEP

LEVEL: Monitor for a set level

(V, A, W or Ω) including:

<= or => than a set level,

within two set levels

or outside of two set levels.

TIMEOUT: Run for a specified

period of time (ms/s).

EXTERNAL INPUT TRIGGER:

Monitor for external triggers via

remote command or DIO.

Up to three conditions can be

applied, the same condition can

be used mulitple times.

CONDITION OPTIONS

JUMP TO STEP: Jump to a pre-

defined step or next step in the

sequence.

DIO OUTPUT LEVEL: Set DIO

output pin as Logic High (5V) or

Logic Low (0V)

STOP: Stop the sequence.

Any action can be added to a

condition, the same action can be

used multiple times.

ACTION FOR A MET CONDITION

Wait for an external trigger via

remote command or DIO

EXTERNAL INPUT TRIGGER

Set DIO output pin as Logic High

(5V) or Logic Low (0V)

DIO OUTPUT

Repeat the step a defined number

of times

REPEAT

ACTION

ACTION

EXAMPLE OF A SINGLE STEP INSIDE A SEQUENCED TEST ROUTINE