PCM2704CDB.B datasheet(7/53 Pages) TI2

7 / 53 page

PCM2704C, PCM2705C, PCM2706C, PCM2707C

www.ti.com

SBFS036B – MAY 2015 – REVISED AUGUST 2015

Pin Functions: PJT Package (PCM2706C/PCM2707C) (continued)

DESCRIPTION

NAME

NO.

I/O

VBUS

—

Connect to USB power (VBUS) for bus-powered operation. Connect to VDD for self-powered operation.

VCCL

—

Analog power supply for headphone amplifier of L-channel(5)

VCCP

—

Analog power supply for DAC, OSC, and PLL(5)

VCCR

—

Analog power supply for headphone amplifier of R-channel(5)

VCOM

—

Common voltage for DAC (VCCP/2). Connect decoupling capacitor to PGND.

VDD

—

Digital power supply(5)

VOUTL

DAC analog output for L-channel

VOUTR

DAC analog output for R-channel

XTI

Crystal oscillator input(1)

XTO

Crystal oscillator output

ZGND

—

Ground for internal regulator

(5)

Connect decoupling capacitor to GND. Supply 3.3 V for self-powered applications.

7 Specifications

7.1 Absolute Maximum Ratings

Over operating free-air temperature range unless otherwise noted.

(1)

MIN

MAX

UNIT

VBUS

–0.3

6.5

Supply voltage

VCCP, VCCL, VCCR, VDD

–0.3

Supply voltage

VCCP, VCCL, VCCR, VDD

±0.1

differences

Ground voltage

PGND, AGNDL, AGNDR, DGND, ZGND

±0.1

differences

HOST

–0.3

6.5

D+, D–, HID0/MS, HID1/MC, HID2/MD, XTI, XTO, DOUT,

Digital input voltage

SSPND, CK, DT, PSEL, FSEL, TEST, TEST0, TEST1, FUNC0,

–0.3

(VDD + 0.3) < 4

FUNC1, FUNC2, FUNC3

VCOM

–0.3

(VCCP + 0.3) < 4

Analog input voltage

VOUTR

–0.3

(VCCR + 0.3) < 4

VOUTL

–0.3

(VCCL + 0.3) < 4

Input current (any pins except supplies)

±10

Ambient temperature under bias

–40

125

°C

Junction temperature

150

°C

Package temperature (IR reflow, peak)

260

°C

Storage temperature, Tstg

–55

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

7.2 ESD Ratings

MAX

UNIT

Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1)

±3000

Electrostatic

V(ESD)

discharge

Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2)

±1500

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

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