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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LM5145 датащи(PDF) 53 Page - Texas Instruments |
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LM5145 датащи(HTML) 53 Page - Texas Instruments |
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53 / 66 page  12.5 Trademarks NexFET™, PowerPAD™, and TI E2E™ are trademarks of Texas Instruments. WEBENCH® is a registered trademark of Texas Instruments. are registered trademarks of Texas Instruments. All trademarks are the property of their respective owners. 12.6 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.7 Glossary TI Glossary This glossary lists and explains terms, acronyms, and definitions. www.ti.com LM5146 SNVSBV0A – JUNE 2021 – REVISED JUNE 2021 Copyright © 2021 Texas Instruments Incorporated Submit Document Feedback 53 Product Folder Links: LM5146 |
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