L9907 datasheet(39/49 Pages) STMICROELECTRONICS

39 / 49 page

DS11800 Rev 5

39/49

L9907

SPI operation

drivers are restarted by cycling EN signal (internal AND of EN1 and EN2 pins)

from high to low to high. A SPI diagnostic read cycle clears the SPI diagnostic flag

and releases the FS_FLAG pin to high.

UV_LS (B6). Low-side FET drivers supply under-voltage

The voltage difference between the low-side gate driver supply pin VCAP and

each of the low-side FET sources are monitored. In case VCAP is lower than

VG_UV_LS threshold for a time longer than tUV_UG, then a low-side under-

voltage fault is detected and internally latched. The low-side FET drivers supply

under-voltage is active if the fault condition is present at least on one of the three

channels.

In case of detected fault, the FET drivers are disabled, the proper SPI bit is set

and the FS_FLAG is asserted low. After removal of the fault condition, the FET

drivers are restarted by cycling EN signal (internal AND of EN1 and EN2 pins)

from high to low to high. A SPI diagnostic read cycle clears the SPI diagnostic flag

and releases the FS_FLAG pin to high.

VSC_HS1 to VSC_HS3 (B5 to B3). High-side external MOSFET over-current

The voltage difference between the high-side external power drain (VDH) and the

source (SHS1-2-3) is monitored and, if it exceeds VSC_HS threshold for a time

longer than TSCoff, then a high-side short circuit fault is detected and internally

latched.

In case of detected fault, all FET drivers are disabled, the proper SPI bit is set and

the FS_FLAG is asserted low. After removal of the fault condition, the FET drivers

are restarted by cycling EN signal (internal AND of EN1 and EN2 pins) from high

to low to high. A SPI diagnostic read cycle clears the SPI diagnostic flag and

releases the FS_FLAG pin to high.

VSC_LS1 to VSC_LS3 (B2 to B0). Low-side external MOSFET over-current

The voltage difference between low-side external power drain (SHS1-2-3) and

source (SLS1-2-3) is monitored and, if it exceeds the VSC_LS threshold for a time

longer than TSCoff, then a low-side short circuit fault is detected and internally

latched.

In case of detected fault, all FET drivers are disabled, the proper SPI bit is set and

the FS_FLAG is asserted low. After removal of the fault condition, the FET drivers

are restarted by cycling the EN signal (internal AND of EN1 and EN2 pins) from

high to low to high. A SPI diagnostic read cycle clears the SPI diagnostic flag and

releases the FS_FLAG pin to high.

L9907 датащи(PDF) 39 Page - STMicroelectronics