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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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BQ28Z610-R1 датащи(PDF) 15 Page - Texas Instruments |
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BQ28Z610-R1 датащи(HTML) 15 Page - Texas Instruments |
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15 / 38 page  7.28 Typical Characteristics (continued) 2.498 2.49805 2.4981 2.49815 2.4982 2.49825 2.4983 2.49835 2.4984 ±40 ±20 0 20 40 60 80 100 120 Temperature (ƒC) C016 Figure 7-14. VCELL Measurement at 2.5-V vs Temperature 3.498 3.49805 3.4981 3.49815 3.4982 3.49825 ±40 ±20 0 20 40 60 80 100 120 Temperature (ƒC) C017 This is the VCELL average for single cell. Figure 7-15. VCELL Measurement at 3.5-V vs Temperature 4.2478 4.24785 4.2479 4.24795 4.248 4.24805 ±40 ±20 0 20 40 60 80 100 120 Temperature (ƒC) C018 A. This is the VCELL average for single cell. Figure 7-16. VCELL Measurement at 4.25-V vs Temperature 99.00 99.05 99.10 99.15 99.20 99.25 ±40 ±20 0 20 40 60 80 100 120 Temperature (ƒC) C019 ISET = 100 mA, RSNS= 1 Ω Figure 7-17. I Measured vs Temperature www.ti.com BQ28Z610-R1 SLUSE07B – JANUARY 2020 – REVISED JANUARY 2022 Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 15 Product Folder Links: BQ28Z610-R1 |
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