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AMC1306E05, AMC1306E25, AMC1306M05, AMC1306M25

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SBAS734C – MARCH 2017 – REVISED JANAURY 2020

Product Folder Links: AMC1306E05 AMC1306E25 AMC1306M05 AMC1306M25

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Changes from Original (March 2017) to Revision A

Page

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Released AMC1306E05 and AMC1306M05 to production .................................................................................................... 1

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Added ±50 µV to first DC Performance sub-bullet to reflect the AMC1306x05 devices ........................................................ 1

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Changed standard deviation from 0884-10 to 0884-11 in first Safety-Related Certifications sub-bullet................................ 1

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Changed VPEAK from 8000 to 7000 and standard deviation from 0884-10 to 0884-11 in first paragraph of Description

section ................................................................................................................................................................................... 1

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Deleted Status column from Device Comparison Table......................................................................................................... 4

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Changed standard deviation from 0884-10 to 0884-11 in DIN V VDE V 0884-11 section of Insulation Specifications table 6

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Changed standard deviation from 0884-10 to 0884-11 in Safety-Related Certifications table .............................................. 7

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Changed prevent to minimize in condition statement of Safety Limiting Values table........................................................... 7

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Added Electrical Characteristics: AMC1306x05 table ........................................................................................................... 8

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Changed test conditions of Analog Inputs test conditions from (AINP – AINN) / 2 to AGND to (AINP + AINN) / 2 to

AGND to include all possible conditions............................................................................................................................... 10

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Changed IIB test condition from Inputs shorted to AGND to AINP = AINN = AGND, IIB = IIBP + IIBN .................................... 10

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Added AINP = AINN = AGND to EO parameter test conditions .......................................................................................... 10

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Changed minus sign to plus or minus sign in typical specification of EG parameter ........................................................... 10

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Changed 10% to 90% to 90% to 10% in test conditions of tf parameter ............................................................................ 12

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Added AMC1306x05 devices to Typical Characteristics section ........................................................................................ 14