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LPV7215MG/NOPB датащи(PDF) 4 Page - Texas Instruments

номер детали LPV7215MG/NOPB
подробное описание детали  LPV7215 Micropower, CMOS Input, RRIO, 1.8-V, Push-Pull Output Comparator
PDF  36 Pages
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производитель  TI2 [Texas Instruments]
домашняя страница  https://www.ti.com
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LPV7215MG/NOPB датащи(HTML) 4 Page - Texas Instruments

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LPV7215
SNOSAI6J – SEPTEMBER 2005 – REVISED AUGUST 2016
www.ti.com
Product Folder Links: LPV7215
Submit Documentation Feedback
Copyright © 2005–2016, Texas Instruments Incorporated
(1)
The maximum power dissipation is a function of TJ(MAX), θJA. The maximum allowable power dissipation at any ambient temperature is
PD = (TJ(MAX) – TA)/ θJA . All numbers apply for packages soldered directly onto a PCB.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
Temperature(1)
–40
125
°C
Supply voltage (V+ – V−)
1.8
5.5
V
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(2)
The maximum power dissipation is a function of TJ(MAX), θJA. The maximum allowable power dissipation at any ambient temperature is
PD = (TJ(MAX) – TA)/ θJA . All numbers apply for packages soldered directly onto a PCB.
6.4 Thermal Information
THERMAL METRIC(1)
LPV7215
UNIT
DBV (SOT-23)
DCK (SC70)
5 PINS
5 PINS
RθJA
Junction-to-ambient thermal resistance(2)
234
456
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
153
110.8
°C/W
RθJB
Junction-to-board thermal resistance
51.7
59.8
°C/W
ψJT
Junction-to-top characterization parameter
38
3.6
°C/W
ψJB
Junction-to-board characterization parameter
51.2
59
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
n/a
n/a
°C/W
(1)
Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device.
(2)
Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using
statistical quality control (SQC) method.
(3)
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4)
Offset voltage average drift determined by dividing the change in VOS at temperature extremes into the total temperature change.
(5)
Positive current corresponds to current flowing into the device.
6.5 Electrical Characteristics: 1.8 V
Unless otherwise specified, all limits are specified for TA = 25°C, V
+ = 1.8V, V− = 0 V, and V
CM = V
+/2, V
O= V
−.(1)
PARAMETER
TEST CONDITIONS
MIN (2)
TYP (3)
MAX (2)
UNIT
IS
Supply current
VCM = 0.3 V
TA = 25°C
580
750
nA
Temperature
extremes
1050
VCM = 1.5 V
TA = 25°C
790
980
Temperature
extremes
1300
VOS
Input offset voltage
VCM = 0 V
TA = 25°C
±0.3
±6
mV
Temperature
extremes
±8
VCM = 1.8 V
TA = 25°C
±0.4
±5
Temperature
extremes
±7
TCVOS
Input offset average drift
See (4)
±1
µV/C
IB
Input bias current (5)
VCM = 1.6 V
−40
fA
IOS
Input offset current
10
fA



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