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TMP105 датащи(PDF) 2 Page - Texas Instruments

номер детали TMP105
подробное описание детали  Digital Temperature Sensor with Two-Wire Interface
PDF  21 Pages
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производитель  TI2 [Texas Instruments]
домашняя страница  https://www.ti.com
Logo TI2 - Texas Instruments

TMP105 датащи(HTML) 2 Page - Texas Instruments

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A1
B1
C1
A2
B2
C2
SDA
SCL
V+
GND
ALERT
A0
WCSP-6PACKAGE
(TOPVIEW)
Note:Pin1isdeterminedbyorientingthepackagemarkingasindicatedinthediagram.
(BumpSideDown)
TMP105
SLLS648D
– FEBRUARY 2005 – REVISED SEPTEMBER 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
PACKAGE
PART NUMBER
SYMBOL
Wafer chip-scale package (YZC)
TMP105YZC
EY
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the
product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Power Supply, V+
7.0V
Input Voltage(2)
–0.5V to 7.0V
Input Current
10mA
Operating Temperature Range
–55°C to +127°C
Storage Temperature Range
–60°C to +130°C
Junction Temperature (TJ max)
+150
°C
ESD Rating:
Human Body Model (HBM)(3)
2000V
Charged-Device Model (CDM)(4)
500V
Machine Model (MM)(5)
200V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2)
Input voltage rating applies to all TMP105 input voltages.
(3)
HBM testing has been tested to TI specifications JEDEC JESD22-A114C.01.
(4)
CDM testing has been tested to TI specifications JEDEC EIA/JESD22-A115A.
(5)
MM testing has been tested to TI specifications JEDEC JESD22-C101C.
PIN ASSIGNMENTS
2
Submit Documentation Feedback
Copyright
© 2005–2011, Texas Instruments Incorporated
Product Folder Link(s): TMP105



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