LMP91002

SNIS163B – APRIL 2012 – REVISED OCTOBER 2015

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Electrical Characteristics (continued)

Unless otherwise specified, all limits ensured for TA = 25°C, VS= (VDD – AGND), VS= 3.3 V and AGND = DGND = 0 V, VREF =

2.5 V, Internal Zero = 20% VREF.

(1)

PARAMETER

TEST CONDITIONS

MIN(2)

TYP(3)

MAX(2)

UNIT

Transimpedance gain

5%

accuracy

Linearity

±0.05%

2.75

3.5

TIA_GAIN

7

7 programmable gain resistors

14

Programmable TIA gains

k

Ω

35

120

350

Maximum external gain resistor

350

20%

3 programmable percentages of VREF

50%

67%

Internal zero voltage

20%

TIA_ZV

3 programmable percentages of VDD

50%

67%

Internal zero voltage

±0.04%

accuracy

Load resistor

10

Ω

RL

Load accuracy

5%

Internal zero 20% VREF

80

110

Power supply rejection ratio

PSRR

2.7 V

≤ VDD ≤ 5.25 V

Internal zero 50% VREF

80

110

dB

at RE pin

Internal zero 67% VREF

80

110

EXTERNAL REFERENCE SPECIFICATION(7)

External voltage reference

1.5

VDD

V

range

VREF

Input impedance

10

M

Ω

(7)

In case of external reference connected, the noise of the reference has to be added.

6.6 I

2C Interface

Unless otherwise specified, all limits ensured for at TA = 25°C, VS= (VDD – AGND), 2.7 V <VS< 3.6 V and AGND = DGND = 0

V, VREF = 2.5 V.

(1)

PARAMETER

TEST CONDITIONS

MIN(2)

TYP(3)

MAX(2)

UNIT

VIH

Input High Voltage

At the temperature extremes

0.7*VDD

V

VIL

Input Low Voltage

At the temperature extremes

0.3*VDD

V

IOUT = 3 mA, at the temperature

VOL

Output Low Voltage

0.4

V

extremes

Hysteresis(4)

At the temperature extremes

0.1*VDD

V

CIN

Input Capacitance on all digital pins

At the temperature extremes

0.5

pF

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond

which the device may be permanently degraded, either mechanically or electrically.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(4)

This parameter is specified by design or characterization.

6

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