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ISL72027ASEH датащи(PDF) 11 Page - Renesas Technology Corp |
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ISL72027ASEH датащи(HTML) 11 Page - Renesas Technology Corp |
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11 / 27 page ![]() FN8862 Rev.1.00 Page 11 of 27 Jul 27, 2017 ISL72027ASEH 2. Specifications 2.5 Test Circuits and Waveforms Propagation Delay LOW to HIGH tPLH Figure 17 Full - 50 110 ns Propagation Delay HIGH to LOW tPHL Figure 17 Full - 50 110 ns Rx Skew tSKEW1 |(tPHL - tPLH)|, Figure 17 Full - 2 35 ns Rx Rise Time tr Figure 17 Full - 2 - ns Rx Fall Time tf Figure 17 Full - 2 - ns VREF/RS Pin Characteristics VREF Pin Voltage VREF -5µA < IREF < 5µA Full 0.45xVCC 1.60 0.55xVCC V -50µA < IREF < 50µA Full 0.4xVCC 1.6 0.6xVCC V RS Pin Input Current IRS(H) RS = 0.75 x VCC Full -10.0 -0.2 - µA IRS(L) VRS = 0V Full -450 -125 0 µA Notes: 7. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless otherwise specified. 8. Parameters with MIN and/or MAX limits are 100% tested at -55°C, +25°C, and +125°C, unless otherwise specified. 9. Typical values are at 3.3V. Parameters with a single entry in the “TYP” column apply to 3.3V. Typical values shown are not guaranteed. 10. Parameter included in functional testing. Figure 10. Driver Test Circuit Figure 11. Driver Bus Voltage Definitions Figure 12. Driver Common-Mode Circuit Test Conditions: VCC = 3V to 3.6V; typical values are at TA = +25°C (Note 9); unless otherwise specified (Note 7). Boldface limits apply across the operating temperature range, -55°C to +125°C and over a total ionizing dose of 75krad(Si) at +25°C with exposure at a low dose rate of <10mrad(Si)/s. (Continued) Parameter Symbol Test Conditions Temp (°C) Min (Note 8) Typ (Note 9) Max (Note 8) Unit CAN_H CAN_L GND D 60Ω V V VO(CAN_H) VO(CAN_L) RECESSIVE DOMINANT 3V 2.3V 1V VOD VO(CAN_H) VO(CAN_L) CAN_H CAN_L GND D 60Ω V -7V < VCM < 12V 330Ω 330Ω |
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