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RT9232BGS датащи(PDF) 6 Page - Richtek Technology Corporation |
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RT9232BGS датащи(HTML) 6 Page - Richtek Technology Corporation |
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6 / 14 page ![]() RT9232B 6 DS9232B-03 March 2007 www.richtek.com Parameter Symbol Test Conditions Min Typ Max Units Reference Error Amplifier Reference Voltage VREF 0.792 0.8 0.808 V Error Amplifier DC gain -- 88 -- dB Gain-Bandwidth product GBW -- 15 -- MHz Slew Rate SR COMP=10pF -- 6 -- V/ μs Soft Start External SS Source Current ISS 7 10 -- μA PWM Controller Gate Driver Upper Drive Source RUG_SC VBOOT − PHASE = 12V VBOOT − UGATE = 1V -- 5.2 -- Ω Upper Drive Sink RUG_SK VBOOT − PHASE = 1V -- 2.7 -- Ω Lower Drive Source RLG_SC VPVCC − LGATE = 1V -- 3.5 -- Ω Lower Drive Sink RLG_SK VLGATE = 1V -- 1.7 -- Ω Driving Capability Upper Drive Source IUG_SC VBOOT − UGATE = 12V -- 1.0 -- A Upper Drive Sink IUG_SK VUGATE − PHASE = 12V -- 2.0 -- A Lower Drive Source ILG_SC VPVCC − LGATE = 12V -- 1.6 -- A Lower Drive Sink ILG_SK VLGATE − GND = 12V -- 3.2 -- A Protection OCSET Current Source IOCSET VOCSET = 11.5V 170 200 230 μA Under-Voltage Protection FB Falling 0.5 0.6 0.7 V Under-Voltage Protection Delay -- 30 -- μs Note 1. Stresses listed as the above "Absolute Maximum Ratings" may cause permanent damage to the device. These are for stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may remain possibility to affect device reliability. Note 2. Devices are ESD sensitive. Handling precaution recommended. Note 3. The device is not guaranteed to function outside its operating conditions. Note 4. θJA is measured in the natural convection at TA = 25°C on a low effective thermal conductivity test board of JEDEC 51-3 thermal measurement standard. |
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