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ST10F272 датащи(PDF) 133 Page - STMicroelectronics |
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ST10F272 датащи(HTML) 133 Page - STMicroelectronics |
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133 / 179 page ![]() ST10F272 Electrical characteristics 133/179 Figure 37. Port2 test mode structure 10. The power supply current is a function of the operating frequency (fCPU is expressed in MHz). This dependency is illustrated in the Figure 38 below. This parameter is tested at VDDmax and at maximum CPU clock frequency with all outputs disconnected and all inputs at VIL or VIH, RSTIN pin at VIH1min: this implies I/O current is not considered. The device is doing the following: - Fetching code from all sectors of IFlash, accessing in read (few fetches) and write to XRAM - Watchdog Timer is enabled and regularly serviced - RTC is running with main oscillator clock as reference, generating a tick interrupts every 192 clock cycles - Four channel of XPWM are running (waves period: 2, 2.5, 3 and 4 CPU clock cycles): no output toggling - Five General Purpose Timers are running in timer mode with prescaler equal to 8 (T2, T3, T4, T5, T6) - ADC is in Auto Scan Continuous Conversion mode on all 16 channels of Port5 - All interrupts generated by XPWM, RTC, Timers and ADC are not serviced 11. The Idle mode supply current is a function of the operating frequency (fCPU is expressed in MHz). This dependency is illustrated in the Figure 37 below. These parameters are tested and at maximum CPU clock with all outputs disconnected and all inputs at VIL or VIH, RSTIN pin at VIH1min. 12. This parameter is tested including leakage currents. All inputs (including pins configured as inputs) at 0 V to 0.1 V or at VDD – 0.1 V to VDD, VAREF = 0 V, all outputs (including pins configured as outputs) disconnected. Besides, the Main Voltage Regulator is assumed off: in case it is not, additional 1mA shall be assumed. Input latch Clock P2.0 CC0IO Output buffer Test mode Alternate data input Fast external interrupt input Flash sense amplifier and column decoder |
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