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SC2441ITSTRT датащи(PDF) 19 Page - Semtech Corporation |
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SC2441ITSTRT датащи(HTML) 19 Page - Semtech Corporation |
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19 / 35 page ![]() 19 2005 Semtech Corp. www.semtech.com POWER MANAGEMENT SC2441 The conduction loss is then P bc=IQ2,rms 2 R ds(on), where R ds(on) is the channel resistance of bottom MOSFET. If the input voltage to output voltage ratio is high (e.g. V in=12V, Vo=1.5V), the duty ratio D will be small. Since the bottom switch conducts with duty ratio (1-D), the corresponding conduction losses can be quite high. Due to non-overlapping conduction between the top and the bottom MOSFET’s, the internal body diode or the external Schottky diode across the drain and source terminals always conducts prior to the turn on of the bottom MOSFET. The bottom MOSFET switches on with only a diode voltage between its drain and source terminals. The switching loss s d o 2 f r 2 1 bs f V I) 1 )( t t ( P δ + + = is negligible due to near zero-voltage switching. The gate loss is estimated as . f V Q R R P s cc g gt g bg = The total bottom switch loss is then P b=Pbc+Pbs+Pbg. Once the power losses P loss for the top (Pt) and bottom (Pb) MOSFET’s are known, thermal and package design at component and system level should be done to verify that the maximum die junction temperature (T j,max, usually 125oC) is not exceeded under the worst-case conditions. The equivalent thermal impedance from junction to ambient ( θ ja) should satisfy . P T T loss max , a max ,j ja − ≤ θ θ ja depends on the die to substrate bonding, packaging material, the thermal contact surface, thermal compound property, the available effective heat sink area and the air flow condition (free or forced convection). Actual temperature measurement of the prototype should be carried out to verify the thermal design. Integrated Power MOSFET Drivers There are four internal MOSFET drivers in step-down section of the SC2441 for driving all the MOSFET’s in a dual-channel step-down converter. Using low gate charge MOSFET’s reduces switching loss. It is possible to trade driver IC losses for MOSFET switching losses by adjusting the gate resistance. Lower gate resistance results in higher gate driving current and faster MOSFET switching. However the driver incurs higher losses. Conversely higher gate drive resistance limits the gate drive current, thus lowering the driver dissipation. MOSFET switching loss is higher. To prevent shoot-through between the top and the bottom MOSFET’s during commutation, one MOSFET should be completely turned off before the other is turned on. In the SC2441 the top and the bottom gate drive pulses are made non-overlapping. When not driving any load, the non- overlapping commutation intervals from the top to the bottom and from the bottom to the top gate drives are set at 62ns and 74ns respectively. If MOSFET’s are driven from the SC2441, the non-overlapping commutation times will decrease due to finite gate-source voltage rise and fall times. The gate-source voltage waveforms of the MOSFET’s should not overlap above their respective thresholds when driven from the SC2441. Use of low gate charge MOSFET’s reduces transition times and the tendency of shoot-through. The combined rise and fall times during both commutations should be less than the preset non-overlapping intervals Current Sensing (Combi-Sense) Inductor current sensing is required for the current-mode control. Although the inductor current can be sensed with a precision resistor in series with the inductor, a novel (US patent 6,441,597) lossless combi-sense technique can also be used in the SC2441. This Semtech proprietary technique has the following advantages 1) lossless current sensing 2) higher signal-to-noise ratio and 3) preventing thermal run-away. The basic arrangement of the combi-sense is shown in Figure 12. In Figure 12 R L is the equivalent series resistance of the output inductor. R s and Cs form a RC network for inductor current sensing. This branch is driven from a small totem pole driver (Q3 and Q4) within the SC2441. The base driving signals Vbe3 and Vbe4 Applications Information (Cont.) |
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