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CS5101A датащи(PDF) 28 Page - Cirrus Logic |
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CS5101A датащи(HTML) 28 Page - Cirrus Logic |
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28 / 39 page ![]() CS5101A CS5102A 28 DS45F6 Figure 17. CS5101A DNL Error Distribution Figure 18. CS5102A DNL Error Distribution 7.2 FFT Tests and Windowing In the factory, the CS5101A and CS5102A are tested using Fast Fourier Transform (FFT) tech- niques to analyze the converters' dynamic perfor- mance. A pure sine wave is applied to the device, and a “time record” of 1024 samples is captured and processed. The FFT algorithm analyzes the spectral content of the digital waveform and distrib- utes its energy among 512 “frequency bins.” As- suming an ideal sine wave, distribution of energy in bins outside of the fundamental and DC can only be due to quantization effects and errors in the CS5101A and CS5102A. |
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