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MCP4021 датащи(PDF) 45 Page - Microchip Technology |
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MCP4021 датащи(HTML) 45 Page - Microchip Technology |
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45 / 64 page ![]() © 2006 Microchip Technology Inc. DS21945E-page 45 MCP4021/2/3/4 6.3 Operational Characteristics Understanding the operational characteristics of the device’s resistor components is important to the system design. 6.3.1 ACCURACY 6.3.1.1 Integral Non-Linearity (INL) INL error for these devices is the maximum deviation between an actual code transition point and its corresponding ideal transition point after offset and gain errors have been removed. These endpoints are from 0x00 to 0x3F. Refer to Figure 6-5. Positive INL means higher resistance than ideal. Negative INL means lower resistance than ideal. FIGURE 6-5: INL Accuracy. 6.3.1.2 Differential Non-Linearity (DNL) DNL error is the measure of variations in code widths from the ideal code width. A DNL error of zero would imply that every code is exactly 1 LSb wide. FIGURE 6-6: DNL Accuracy. 6.3.1.3 Ratiometric Temperature Coefficient The ratiometric temperature coefficient quantifies the error in the ratio RAW/RWB due to temperature drift. This is typically the critical error when using a potentiometer device (MCP4021 and MCP4023) in a voltage divider configuration. 6.3.1.4 Absolute Temperature Coefficient The absolute temperature coefficient quantifies the error in the end-to-end resistance (nominal resistance RAB) due to temperature drift. This is typically the critical error when using a rheostat device (MCP4022 and MCP4024) in an adjustable resistor configuration. 111 110 101 100 011 010 001 000 Digital Input Code Actual Transfer Function INL < 0 Ideal Transfer Function INL < 0 Digital Pot Output 111 110 101 100 011 010 001 000 Digital Input Code Actual Transfer Function Ideal Transfer Function Narrow Code < 1 LSb Wide Code, > 1 LSb Digital Pot Output |
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