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SC26C94 датащи(PDF) 23 Page - NXP Semiconductors

номер детали SC26C94
подробное описание детали  Quad universal asynchronous receiver/transmitter QUART
PDF  33 Pages
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производитель  PHILIPS [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

SC26C94 датащи(HTML) 23 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
SC26C94
Quad universal asynchronous receiver/transmitter (QUART)
1995 May 1
23
AC ELECTRICAL CHARACTERISTICS5, 6, 7, 8
SYMBOL
FIGURE
PARAMETER
LIMITS
UNIT
SYMBOL
FIGURE
PARAMETER
Min
Typ
Max
UNIT
Reset timing
tRES
7
Reset pulse width
200
ns
I/O Port timing
tPS
8
I/O input setup time before RDN Low
0
ns
tPH
8
I/O input hold time after RDN High
0
ns
tPD
8
I/O output valid from
WRN High
RDN Low
110
110
ns
ns
Interrupt timing
tIR
9
IRQN negated or I/O output High from:
Read RHR (RxRDY/FFULL interrupt)
Write THR (TxRDY interrupt)
Reset command (break change interrupt)
Reset command (I/O change interrupt)
Stop C/T command (counter interrupt)
Write IMR (clear of interrupt mask bit)
With respect to a
3.6864MHz clock
on pin X1/CLK
100
100
100
100
100
100
ns
ns
ns
ns
ns
ns
Clock timing
tCLK
10
X1/CLK low/high time
125/100
ns
tCLK
10
X1/CLK low/high time (above 4MHz; X1/CLK
÷ 2 active)
56/56
ns
tCLK
10
X1/CLK frequency
09
3.6864
8.0
MHz
tCTC
10
Counter/timer clock high or low time
60
ns
fCTC
10
Counter/timer clock frequency
09
8
MHz
tRX
10
RxC high or low time
30
ns
fRX
10
RxC frequency (16X)
RxC frequency (1X)
09
09
16
1.0
MHz
MHz
tTX
10
TxC high or low time
30
ns
fTX
10
TxC frequency (16X)
TxC frequency (1X)
09
09
16
1.0
MHz
MHz
Transmitter timing
tTXD
11
TxD output delay from TxC low
120
ns
tTCS
11
TxC output delay from TxD output data
–20
+20
ns
Receiver timing
tRXS
12
RxD data setup time to RxC high
100
ns
tRXH
12
RxD data hold time from RxC high
100
ns
NOTES:
1. Stress above these listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only.
Functional operation of the device at these or any other condition above those indicated in the operation section of the specification is not
implied.
2. For operating at elevated temperatures, the device must be derated based on +150oC maximum junction temperature.
3. This product includes circuitry specifically designed for the protection of its internal devices from damaging effects of excessive static
charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying any voltages larger than the rated maxima.
4. Parameters are valid over specified temperature range. See ordering information table for applicable temperature range and operating
supply range.
5. All voltage measurements are referenced to ground (GND). For testing, all inputs swing between 0.4V and 2.4V with a transition time of 20ns
maximum. For X1/CLK this swing is between 0.4V and 4.4V. All time measurements are referenced at input voltages of VIL and VIH, as
appropriate.
6. Typical values are at +25oC, typical supply voltages, and typical processing parameters.
7. Test condition for interrupt and I/O outputs: CL = 50pF, RL = 2.7kΩ to VCC. Test conditions for rest of outputs: CL = 150pF.
8. Timing is illustrated and referenced to the WRN and RDN inputs. The device may also be operated with CEN as the ‘strobing’ input. CEN
and RDN (also CEN and WRN) are ANDed internally. As a consequence, the signal asserted last initiates the cycle and the signal negated
first terminates the cycle.
9. This value is not tested, but is guaranteed by design. For tCLK minimum test rate is 2.0MHz.



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