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SC26C94 датащи(PDF) 23 Page - NXP Semiconductors |
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SC26C94 датащи(HTML) 23 Page - NXP Semiconductors |
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23 / 33 page ![]() Philips Semiconductors Product specification SC26C94 Quad universal asynchronous receiver/transmitter (QUART) 1995 May 1 23 AC ELECTRICAL CHARACTERISTICS5, 6, 7, 8 SYMBOL FIGURE PARAMETER LIMITS UNIT SYMBOL FIGURE PARAMETER Min Typ Max UNIT Reset timing tRES 7 Reset pulse width 200 ns I/O Port timing tPS 8 I/O input setup time before RDN Low 0 ns tPH 8 I/O input hold time after RDN High 0 ns tPD 8 I/O output valid from WRN High RDN Low 110 110 ns ns Interrupt timing tIR 9 IRQN negated or I/O output High from: Read RHR (RxRDY/FFULL interrupt) Write THR (TxRDY interrupt) Reset command (break change interrupt) Reset command (I/O change interrupt) Stop C/T command (counter interrupt) Write IMR (clear of interrupt mask bit) With respect to a 3.6864MHz clock on pin X1/CLK 100 100 100 100 100 100 ns ns ns ns ns ns Clock timing tCLK 10 X1/CLK low/high time 125/100 ns tCLK 10 X1/CLK low/high time (above 4MHz; X1/CLK ÷ 2 active) 56/56 ns tCLK 10 X1/CLK frequency 09 3.6864 8.0 MHz tCTC 10 Counter/timer clock high or low time 60 ns fCTC 10 Counter/timer clock frequency 09 8 MHz tRX 10 RxC high or low time 30 ns fRX 10 RxC frequency (16X) RxC frequency (1X) 09 09 16 1.0 MHz MHz tTX 10 TxC high or low time 30 ns fTX 10 TxC frequency (16X) TxC frequency (1X) 09 09 16 1.0 MHz MHz Transmitter timing tTXD 11 TxD output delay from TxC low 120 ns tTCS 11 TxC output delay from TxD output data –20 +20 ns Receiver timing tRXS 12 RxD data setup time to RxC high 100 ns tRXH 12 RxD data hold time from RxC high 100 ns NOTES: 1. Stress above these listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only. Functional operation of the device at these or any other condition above those indicated in the operation section of the specification is not implied. 2. For operating at elevated temperatures, the device must be derated based on +150oC maximum junction temperature. 3. This product includes circuitry specifically designed for the protection of its internal devices from damaging effects of excessive static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying any voltages larger than the rated maxima. 4. Parameters are valid over specified temperature range. See ordering information table for applicable temperature range and operating supply range. 5. All voltage measurements are referenced to ground (GND). For testing, all inputs swing between 0.4V and 2.4V with a transition time of 20ns maximum. For X1/CLK this swing is between 0.4V and 4.4V. All time measurements are referenced at input voltages of VIL and VIH, as appropriate. 6. Typical values are at +25oC, typical supply voltages, and typical processing parameters. 7. Test condition for interrupt and I/O outputs: CL = 50pF, RL = 2.7kΩ to VCC. Test conditions for rest of outputs: CL = 150pF. 8. Timing is illustrated and referenced to the WRN and RDN inputs. The device may also be operated with CEN as the ‘strobing’ input. CEN and RDN (also CEN and WRN) are ANDed internally. As a consequence, the signal asserted last initiates the cycle and the signal negated first terminates the cycle. 9. This value is not tested, but is guaranteed by design. For tCLK minimum test rate is 2.0MHz. |
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