4 Specifications

4.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)

MIN

MAX

UNIT

VCC

Supply voltage range

–0.5

6

V

IIK (2)

Input clamp current

(VI < 0 V or VI > VCC)

±20

mA

IOK (2)

Output clamp current

(VO < 0 V or VO > VCC)

±50

mA

IO

Continuous output current

(VO > 0 V or VO < VCC)

±50

mA

Continuous current through VCC or GND

±200

mA

Tstg

Storage temperature range

–65

150

°C

(1)

Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating

conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

4.2 ESD Ratings

VALUE

UNIT

V(ESD)

Electrostatic discharge

Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)

±2000

V

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

4.3 Recommended Operating Conditions

over recommended operating free-air temperature range (unless otherwise noted)(1)

TA = 25°C

-55°C to 125°C

-40°C to 85°C

UNIT

MIN

MAX

MIN

MAX

MIN

MAX

VCC

Supply voltage

1.5

5.5

1.5

5.5

1.5

5.5

V

VIH

High-level input voltage

VCC = 1.5 V

1.2

1.2

1.2

V

VCC = 3 V

2.1

2.1

2.1

VCC = 5.5 V

3.85

3.85

3.85

VIL

Low-level input voltage

VCC = 1.5 V

0.3

0.3

0.3

V

VCC = 3 V

0.9

0.9

0.9

VCC = 5.5 v

1.65

1.65

1.65

VI

Input voltage

0

VCC

0

VCC

0

VCC

V

VO

Output voltage

0

VCC

0

VCC

0

VCC

V

IOH

High-level output current

VCC = 4.5 V to 5.5

V

-24

-24

-24

mA

IOL

Low-level output current

VCC = 4.5 V to 5.5

V

24

24

24

mA

Δt/Δv Input transition rise or fall rate

VCC = 1.5 V to 3 V

50

50

50

ns/V

VCC = 3.6 V to 5.5

V

20

20

20

(1)

All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

CD74AC238

SCHS331B – FEBRUARY 2003 – REVISED JULY 2024

www.ti.com

4

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