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PLHS501 датащи(PDF) 7 Page - NXP Semiconductors |
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PLHS501 датащи(HTML) 7 Page - NXP Semiconductors |
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7 / 12 page ![]() +5V CL R1 R2 S1 GND BZ BY INPUTS I0 I10 BW BX OUTPUTS C2 C1 DUT NOTE: C1 and C2 are to bypass VCC to GND. VCC OX Philips Semiconductors Programmable Logic Devices Product specification PLHS501/PLHS501I Programmable macro logic PML ™ October 22, 1993 7 DC ELECTRICAL CHARACTERISTICS Commercial= 0 °C ≤ T amb ≤ +75°C, 4.75V ≤ VCC ≤ 5.25V Industrial = –40 °C ≤ T amb ≤ +85°C, 4.5V ≤ VCC ≤ 5.5V LIMITS SYMBOL PARAMETER TEST CONDITION MIN TYP1 MAX UNIT Input voltage2 VIL Low VCC = MIN 0.8 V VIH High VCC = MAX 2.0 V VIC Clamp2, 3 VCC = MIN, IIN = –12mA –0.8 –1.2 V Output voltage VCC = MIN VOL Low2, 4 IOL = 10mA 0.45 V VOH High2, 5 IOH = –2mA 2.4 V Input current VCC = MAX IIL Low VIN = 0.45V –100 µA IIH High VIN = 5.5V 40 µA Output current VCC = MAX IO(OFF) Hi-Z state9 VOUT = 5.5V 80 µA VOUT = 0.45V –140 IOS Short circuit3, 5, 6 VOUT = 0V –15 –70 mA ICC VCC supply current8 VCC = MAX 225 295 mA Capacitance VCC = 5V CIN Input VIN = 2.0V 8 pF CB I/O VOUT = 2.0V 15 pF NOTES: 1. All typical values are at VCC = 5V, Tamb = +25°C. 2. All voltage values are with respect to network ground terminal. 3. Test one at a time. 4. For Pins 15 – 19, 21 – 27 and 37 – 40, VOL is measured with Pins 5 and 41 = 8,75V, Pin 43 = 0V and Pins 42 and 44 = 4.5V. For Pins 28 – 33 and 35 – 36, VOL is measured under same conditions EXCEPT Pin 44 = 0V. 5. VOH is measured with Pins 5 and 41 = 8.75V, Pins 42 and 43 = 4.5V and Pin 44 = 0V. 6. Duration of short circuit should not exceed 1 second. 7. ICC is measured with all dedicated inputs at 0V and bidirectional and output pins open. 8. Measured at VT = VOL + 0.5V. 9. Leakage values are a combination of input and output leakage. TEST LOAD CIRCUITS VOLTAGE WAVEFORMS MEASUREMENTS: All circuit delays are measured at the +1.5V level of inputs and outputs, unless otherwise specified. Input Pulses 90% 10% 2.5ns 90% 10% +3.0V +3.0V 0V 0V tR tF 2.5ns 2.5ns 2.5ns |
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