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DSP56853 датащи(PDF) 21 Page - Freescale Semiconductor, Inc

номер детали DSP56853
подробное описание детали  16-bit Digital Signal Controllers
PDF  60 Pages
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производитель  FREESCALE [Freescale Semiconductor, Inc]
домашняя страница  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

DSP56853 датащи(HTML) 21 Page - Freescale Semiconductor, Inc

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Introduction
56853 Technical Data, Rev. 6
Freescale Semiconductor
21
54
TCK
Input
Test Clock Input (TCK)—This input pin provides a gated clock to
synchronize the test logic and to shift serial data to the
JTAG/Enhanced OnCE port. The pin is connected internally to a
pull-down resistor.
52
TDI
Input
Test Data Input (TDI)—This input pin provides a serial input data
stream to the JTAG/Enhanced OnCE port. It is sampled on the rising
edge of TCK and has an on-chip pull-up resistor.
51
TDO
Output (Z)
Test Data Output (TDO)—This tri-statable output pin provides a
serial output data stream from the JTAG/Enhanced OnCE port. It is
driven in the Shift-IR and Shift-DR controller states, and changes on
the falling edge of TCK.
53
TMS
Input
Test Mode Select Input (TMS)—This input pin is used to sequence
the JTAG TAP controller’s state machine. It is sampled on the rising
edge of TCK and has an on-chip pull-up resistor.
Note:
Always tie the TMS pin to VDD through a 2.2K resistor.
50
TRST
Input
Test Reset (TRST)—As an input, a low signal on this pin provides a
reset signal to the JTAG TAP controller. To ensure complete
hardware reset, TRST should be asserted whenever RESET is
asserted. The only exception occurs in a debugging environment,
since the Enhanced OnCE/JTAG module is under the control of the
debugger. In this case it is not necessary to assert TRST when
asserting RESET. Outside of a debugging environment RESET
should be permanently asserted by grounding the signal, thus
disabling the Enhanced OnCE/JTAG module on the controller.
Note:
For normal operation, connect TRST directly to VSS. If the design
is to be used in a debugging environment, TRST may be tied to VSS through
a 1K resistor.
49
DE
Input/Output
Debug Event (DE)—This is an open-drain, bidirectional, active low
signal. As an input, it is a means of entering debug mode of operation
from an external command controller. As an output, it is a means of
acknowledging that the chip has entered debug mode.
This pin is connected internally to a weak pull-up resistor.
Table 3-1. 56853 Signal and Package Information for the 128-pin LQFP (Continued)
Pin No.
Signal Name
Type
Description



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