CS42435-DMZ datasheet(56/58 Pages) CIRRUS

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DS685F1

CS42435

11.PARAMETER DEFINITIONS

Dynamic Range

The ratio of the rms value of the signal to the rms sum of all other spectral components over the specified

bandwidth. Dynamic Range is a signal-to-noise ratio measurement over the specified band width made with

a -60 dBFS signal. 60 dB is added to resulting measurement to refer the measurement to full-scale. This

technique ensures that the distortion components are below the noise level and do not affect the measure-

ment. This measurement technique has been accepted by the Audio Engineering Society, AES17-1991,

and the Electronic Industries Association of Japan, EIAJ CP-307. Expressed in decibels.

Total Harmonic Distortion + Noise

The ratio of the rms value of the signal to the rms sum of all other spectral components over the specified

band width (typically 10 Hz to 20 kHz), including distortion components. Expressed in decibels. Measured

at -1 and -20 dBFS as suggested in AES17-1991 Annex A.

Frequency Response

A measure of the amplitude response variation from 10 Hz to 20 kHz relative to the amplitude response at

1 kHz. Units in decibels.

Interchannel Isolation

A measure of crosstalk between the left and right channel pairs. Measured for each channel at the convert-

er's output with no signal to the input under test and a full-scale signal applied to the other channel. Units in

decibels.

Interchannel Gain Mismatch

The gain difference between left and right channel pairs. Units in decibels.

Gain Error

The deviation from the nominal full-scale analog output for a full-scale digital input.

Gain Drift

The change in gain value with temperature. Units in ppm/°C.

Offset Error

The deviation of the mid-scale transition (111...111 to 000...000) from the ideal. Units in mV.

12.REFERENCES

1. Cirrus Logic, Techniques to Measure and Maximize the Performance of a 120 dB, 96 kHz A/D Converter

Integrated Circuit, by Steven Harris, Steven Green and Ka Leung. Presented at the 103rd Convention of the

Audio Engineering Society, September 1997.

2. Cirrus Logic, The Effects of Sampling Clock Jitter on Nyquist Sampling Analog-to-Digital Converters, and

on Oversampling Delta Sigma ADC's, by Steven Harris. Paper presented at the 87th Convention of the Au-

dio Engineering Society, October 1989.

3. Philips Semiconductor, The I²C-Bus Specification: Version 2.1, January 2000.

http://www.semiconductors.philips.com

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