NE5019F datasheet(4/6 Pages) PHILIPS

4 / 6 page

Philips Semiconductors Linear Products

Product specification

NE/SE5018/5019

8-Bit

µp-compatible D/A converter

August 31, 1994

754

AC ELECTRICAL CHARACTERISTICS1

VCC = ±15V, TA = 25°C

SYMBOL

PARAMETER

FROM

TEST CONDITIONS

NE/SE5018/19

UNIT

SYMBOL

PARAMETER

FROM

TEST CONDITIONS

Min

Typ

Max

UNIT

tSLH

Settling time

±1/2LSB

Input

All bits low-to-high2

1.8

µs

tSHL

Settling time

±1/2LSB

Input

All bits high-to-low3

2.3

µs

tPLH

Propagation delay

Output

Input

All bits switched low-to-high2

300

tPHL

Propagation delay

Output

Input

All bits switched high-to-low3

150

tPLSB

Propagation delay

Output

Input

1 LSB change2, 3

150

tPLH

Propagation delay

Output

Low-to-high transition4

300

tPHL

Propagation delay

Output

High-to-low transition5

150

Setup time

Input

1, 6

100

Hold time

Input

1, 6

tPW

Latch enable pulse width

1, 6

150

NOTES:

1. Refer to Figure 2.

2. See Figure 5.

3. See Figure 6.

4. See Figure 7.

5. See Figure 8.

6. See Figure 9.

7. For reference currents>3mA, use of an external buffer is required.

Figure 1. DC Parametric Test Configuration

0.47

µF

MSB

LSB

9 8 7 6 5 4 3 2

DAC

COMP

5018

COMP

AMP

SUM

ANA GND

DIG GND

VREF IN

VREF OUT

VOUT

VCC+

0.01

µF

0.1

µF

VCC–

OUTPUT

22pF

1N914

100pF

5.000V

Figure 2. AC Parametric Test Configuration

MSB

LSB

9 8 7 6 5 4 3 2

DAC

COMP

5018

COMP

AMP

SUM

ANA GND

DIG GND

OUTPUT

22pF

1N914

100pF

0.47

µF

VOUT

VCC+

0.01

µF

0.1

µF

VCC–

VREF IN

Figure 3. Full-/Zero-Scale Adjust — Unipolar Output (0–10V)

0.47

µF

MSB

LSB

10k

10T

80k

9 8 7 6 5 4 3 2

DAC

COMP

5018

COMP

AMP

SUM

ANA GND

DIG GND

VREF OUT

VREF ADJ

VOUT

VCC+

0.01

µF

0.1

µF

VCC–

OUTPUT

22pF

1N914

100pF

VCC+

20k

10T

ZERO SCALE

ADJUST

VCC–

FULL SCALE

ADJUST

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