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SY10E212JC датащи(PDF) 3 Page - Micrel Semiconductor

номер детали SY10E212JC
подробное описание детали  3-BIT SCANNABLE REGISTER
PDF  4 Pages
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производитель  MICREL [Micrel Semiconductor]
домашняя страница  http://www.micrel.com
Logo MICREL - Micrel Semiconductor

SY10E212JC датащи(HTML) 3 Page - Micrel Semiconductor

  SY10E212JC Datasheet HTML 1Page - Micrel Semiconductor SY10E212JC Datasheet HTML 2Page - Micrel Semiconductor SY10E212JC Datasheet HTML 3Page - Micrel Semiconductor SY10E212JC Datasheet HTML 4Page - Micrel Semiconductor  
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SY10E212
SY100E212
Micrel, Inc.
M9999-032206
hbwhelp@micrel.com or (408) 955-1690
TA = 0
°CTA = +25°CTA = +85°C
Symbol
Parameter
Min.
Typ.
Max.
Min.
Typ.
Max.
Min.
Typ.
Max.
Unit
Condition
IIH
Input HIGH Current
——
150
——
150
——
150
µA
IEE
Power Supply Current
mA
10E
80
96
80
96
80
96
100E
80
96
80
96
92
110
TA = 0
°CTA = +25°CTA = +85°C
Symbol
Parameter
Min.
Typ.
Max.
Min.
Typ.
Max.
Min.
Typ.
Max.
Unit
Condition
tPD
Propagation Delay to Output
ps
CLK
575
800
1025
575
800
1025
575
800
1025
MR
575
800
1025
575
800
1025
575
800
1025
CLK to S-OUT
575
800
1025
575
800
1025
575
800
1025
tS
Set-up Time
ps
D
175
25
175
25
175
25
SHIFT
150
–50
150
–50
150
–50
LOAD
225
50
225
50
225
50
S-IN
150
–50
150
–50
150
–50
tH
Hold Time
ps
D
250
25
250
25
250
25
SHIFT
300
100
300
100
300
100
LOAD
225
0
225
0
225
0
S-IN
300
100
300
100
300
100
tRR
Reset Recovery
600
350
600
350
600
350
ps
tskew
Within-Device Skew
100
——
100
——
100
ps
1
tskew
Within-Gate Skew
50
——
50
——
50
ps
2
tr
Rise/Fall Times
275
425
650
275
425
650
275
425
650
ps
tf
20% to 80%
DC ELECTRICAL CHARACTERISTICS
VEE = VEE (Min.) to VEE (Max.); VCC = VCCO = GND
TRUTH TABLE
LOAD
SHIFT
MR
Mode
L
L
L
Load
H
L
L
Hold
X
H
L
Shift
X
X
H
Reset
AC ELECTRICAL CHARACTERISTICS
VEE = VEE (Min.) to VEE (Max.); VCC = VCCO = GND
Notes:
1. Within-device skew is defined as identical transitions on similar paths through a device.
2. Within-gate skew is defined as the difference in delays between various outputs of a gate when driven from the same input.



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