22

Data Sheet

8 Mbit SPI Serial Flash

SST25VF080B

©2006 Silicon Storage Technology, Inc.

S71296-01-000

1/06

Parameter

Description

Test Condition

Maximum

Output Pin Capacitance

12 pF

Input Capacitance

6 pF

T10.0 1296

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Symbol

Parameter

Minimum Specification

Units

Test Method

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Endurance

10,000

Cycles

JEDEC Standard A117

Data Retention

100

Years

JEDEC Standard A103

Latch Up

mA

JEDEC Standard 78

T11.0 1296

25 MHz

50 MHz

Symbol

Parameter

Min

Max

Min

Max

Units

1. Maximum clock frequency for Read Instruction, 03H, is 25 MHz

Serial Clock Frequency

25

50

MHz

Serial Clock High Time

18

9

ns

Serial Clock Low Time

18

9

ns

Serial Clock Rise Time (Slew Rate)

0.1

0.1

V/ns

Serial Clock Fall Time (Slew Rate)

0.1

0.1

V/ns

3. Relative to SCK.

CE# Active Setup Time

10

5

ns

CE# Active Hold Time

10

5

ns

CE# Not Active Setup Time

10

5

ns

TCHH3

CE# Not Active Hold Time

10

5

ns

CE# High Time

100

50

ns

CE# High to High-Z Output

15

8

ns

SCK Low to Low-Z Output

0

0

ns

Data In Setup Time

5

2

ns

Data In Hold Time

5

5

ns

HOLD# Low Setup Time

10

5

ns

HOLD# High Setup Time

10

5

ns

HOLD# Low Hold Time

10

5

ns

HOLD# High Hold Time

10

5

ns

HOLD# Low to High-Z Output

20

8

ns

HOLD# High to Low-Z Output

15

8

ns

Output Hold from SCK Change

0

0

ns

Output Valid from SCK

15

8

ns

Sector-Erase

25

25

ms

Block-Erase

25

25

ms

Chip-Erase

50

50

ms

Byte-Program

10

10

µs

T12.0 1296