REVISION A 2/12/15

87354 DATA SHEET

3

÷4/÷5 DIFFERENTIAL-TO-

3.3V LVPECL CLOCK GENERATOR

TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, V

CC = 3.0V

TO

3.465V, V

EE = 0, T

A

= -40°C TO 85°C

TABLE 4C. DIFFERENTIAL DC CHARACTERISTICS, V

CC = 3.0V

TO

3.465V, V

EE = 0, T

A

= -40°C TO 85°C

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

V

CC

Positive Supply Voltage

3.0

3.3

3.465

V

I

EE

Power Supply Current

104

mA

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

I

IH

Input High Current

CLK

V

CC = VIN = 3.465V

150

µA

nCLK

V

CC = VIN = 3.465V

5

µA

I

IL

Input Low Current

CLK

V

CC = 3.465V, VIN = 0V

-5

µA

nCLK

V

CC = 3.465V, VIN = 0V

-150

µA

V

PP

Peak-to-Peak Input Voltage

0.15

1.3

V

V

CMR

Common Mode Input Voltage;

NOTE 1, 2

V

EE + 0.5

V

CC - 0.85

V

NOTE 1: Common mode voltage is defined as V

IH.

NOTE 2: For single ended applications, the maximum input voltage for CLK, nCLK is V

CC + 0.3V.

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

V

IH

Input High Voltage

2

V

CC + 0.3

V

V

IL

Input Low Voltage

-0.3

0.8

V

I

IH

Input High Current

MR, F_SEL

V

CC = VIN = 3.465V

150

µA

I

IL

Input Low Current

MR, F_SEL

V

CC = 3.465V, VIN = 0V

-5

µA

TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, V

CC = 3.0V

TO

3.465V, V

EE = 0, T

A

= -40°C TO 85°C

ABSOLUTE MAXIMUM RATINGS

Supply Voltage, V

CC

4.6V

Inputs, V

I

-0.5V to V

CC + 0.5 V

Outputs, I

O

Continuous Current

50mA

Surge Current

100mA

Package Thermal Impedance,

θ

JA

112.7°C/W (0 lfpm)

Storage Temperature, T

STG

-65°C to 150°C

NOTE: Stresses beyond those listed under Absolute

Maximum Ratings may cause permanent damage to the

device.These ratings are stress specifications only. Functional

operation of product at these conditions or any conditions

beyond those listed in the DC Characteristics or AC Charac-

teristics is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect product reliability.