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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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ADM1063ASU датащи(PDF) 6 Page - Analog Devices |
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ADM1063ASU датащи(HTML) 6 Page - Analog Devices |
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6 / 36 page  ADM1063 Rev. 0 | Page 6 of 36 Parameter Min Typ Max Unit Test Conditions/Comments Standard (Digital Output) Mode (PDO1 to PDO10) VOH 2.4 V VPU (pull-up to VDDCAP or VPn) = 2.7 V, IOH = 0.5 mA 4.5 V VPU to VPn = 6.0 V, IOH = 0 mA VPU − 0.3 V VPU ≤ 2.7 V, IOH = 0.5 mA VOL 0 0.50 V IOL = 20 mA IOL3 20 mA Maximum sink current per PDO pin ISINK3 60 mA Maximum total sink for all PDO pins RPULL-UP 20 kΩ Internal pull-up ISOURCE (VPn)3 2 mA Current load on any VPn pull-ups, that is, total source current available through any number of PDO pull-up switches configured onto any one Three-State Output Leakage Current 10 µA VPDO = 14.4 V Oscillator Frequency 90 100 110 kHz All on-chip time delays derived from this clock DIGITAL INPUTS (VXn, A0, A1) Input High Voltage, VIH 2.0 V Maximum VIN = 5.5 V Input Low Voltage, VIL 0.8 V Maximum VIN = 5.5 V Input High Current, IIH −1 µA VIN = 5.5 V Input Low Current, IIL 1 µA VIN = 0 Input Capacitance 5 pF Programmable Pull-Down Current, IPULL-DOWN 20 µA VDDCAP = 4.75, TA = 25°C if known logic state is required SERIAL BUS DIGITAL INPUTS (SDA, SCL) Input High Voltage, VIH 2.0 V Input Low Voltage, VIL 0.8 V Output Low Voltage, VOL3 0.4 V IOUT = −3.0 mA SERIAL BUS TIMING Clock Frequency, fSCLK 400 kHz Bus Free Time, tBUF 4.7 µs Start Setup Time, tSU;STA 4.7 µs Start Hold Time, tHD;STA 4 µs SCL Low Time, tLOW 4.7 µs SCL High Time, tHIGH 4 µs SCL, SDA Rise Time, tr 1000 µs SCL, SDA Fall Time, tf 300 µs Data Setup Time, tSU;DAT 250 ns Data Hold Time, tHD;DAT 5 ns Input Low Current, IIL 1 µA VIN = 0 SEQUENCING ENGINE TIMING State Change Time 10 µs 1 At least one of the VH, VP1 to VP4 pins must be ≥3.0 V to maintain the device supply on VDDCAP. 2 All temperature sensor measurements are taken with round-robin loop enabled and at least one other voltage input being measured. 3 Specification is not production tested, but is supported by characterization data at initial product release. |
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