HCTS540MS

FN2232 Rev 2.00

Page 6 of 10

September 1995

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4 (Note 1)

NOTE:

1. Except FN test which will be performed 100% Go/No-Go.

TABLE 8. STATIC BURN-IN AND DYNAMIC BURN-IN TEST CONNECTIONS

OPEN

GROUND

1/2 VCC = 3V

 0.5V

VCC = 6V

 0.5V

OSCILLATOR

50kHz

25kHz

STATIC BURN-IN I TEST CONNECTIONS (Note 1)

11 - 18

1 - 10, 19

-

20

-

-

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

11 - 18

10

-

1 - 9, 19, 20

-

-

DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)

-

10

11 - 18

20

1, 19

2 - 9

NOTES:

1. Each pin except VCC and GND will have a resistor of 10K

  5% for static burn-in.

2. Each pin except VCC and GND will have a resistor of 680

  5% for dynamic burn-in.

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V

 0.5V

11 - 18

10

1 - 9, 19, 20

NOTE: Each pin except VCC and GND will have a resistor of 47K

  5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.