HCTS299MS

FN3069 Rev 1.00

Page 8 of 12

August 1995

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4 (Note 1)

NOTE: 1. Except FN test which will be performed 100% Go/No-Go.

TABLE 8. STATIC BURN-IN AND DYNAMIC

OPEN

GROUND

1/2 VCC = 3V

 0.5V

VCC = 6V

 0.5V

OSCILLATOR

50kHz

25kHz

STATIC BURN-IN I TEST CONNECTIONS (Note 1)

8, 17

1 - 7, 9 - 16, 18, 19

-

20

-

-

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

8, 17

10

-

1 - 7, 9, 11 - 16, 18 - 20

-

-

DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)

-

2, 3, 10, 18, 19

4 - 8, 13 - 17

1, 9, 20

12

11

NOTES:

1. Each pin except VCC and GND will have a resistor of 10k

  5% for static burn-in

2. Each pin except VCC and GND will have a resistor of 680

  5% for dynamic burn-in

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V

 0.5V

8, 17

10

1 - 7, 9, 11 - 16, 18 - 20

NOTE: Each pin except VCC and GND will have a resistor of 47K

  5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.