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ADC0820 датащи(PDF) 13 Page - NXP Semiconductors

номер детали ADC0820
подробное описание детали  8-Bit, high-speed, mP-compatible A/D converter with track/hold function
PDF  14 Pages
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производитель  PHILIPS [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

ADC0820 датащи(HTML) 13 Page - NXP Semiconductors

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Philips Semiconductors Linear Products
Product specification
ADC0820
8-Bit, high-speed,
µP-compatible A/D converter with
track/hold function
August 31, 1994
580
therefore not necessary to filter out these transients by putting an
external cap on the VIN terminal, if an input amplifier that can settle
within 600ns is used to drive the input. The NE530 is a suitable op
amp for driving the input of the ADC0820.
Inherent Sample-Hold
Another benefit of the ADC0820’s input mechanism is its ability to
measure a variety of high-speed signals without the help of an
external sample-and-hold. In a conventional SAR type converter,
regardless of its speed, the input must remain at least 1/2LSB
stable throughout the conversion process if full accuracy is to be
maintained. Consequently, for many high-speed signals, this signal
must be externally sampled, and held stationary during the
conversion.
Sampled data comparators, by nature of their input switching,
already accomplish this function to a large degree (Section 1.2).
Although the conversion time for the ADC0820 is 1.5
µs, the time
through which VIN must be 1/2LSB stable is much smaller. Since
the MS flash ADC uses VIN as its “compare” input and the LS ADC
uses VIN as its “zero” input, the ADC0820 only “samples” VIN when
WR is Low. Even though the two flashes are not done
simultaneously, the analog signal is measured at one instant. The
value of VIN approximately 100ns after the rising edge of WR (100ns
due to internal logic propagation delay) will be the measured value.
Input signals with slew rates typically below 100mV/
µs can be
converted without error. However, because of the input time
constants, and charge injection through the opened comparator
input switches, faster signals may cause errors. Still, the ADC0820’s
loss in accuracy for a given increase in signal slope is far less than
what would be witnessed in a conventional successive
approximation device. An SAR type converter with a conversion
time as fast as 1
µs would still not be able to measure a 5V, 1kHz
sine wave without the aid of an external sample-and-hold. The
ADC0820, with no such help, can typically measure 5V, 7kHz
waveforms.
+5V
0.1
µF 47µF
VREF
VIN
VDD
VDD
VIN
VREF(+)
VREF(–)
GND
MODE
INT
RD
DB7
DB0
RDY
CS
Figure 11. 8-Bit Resolution Configuration
+
(+4VCC, 3kHz MAX)
+5V
25k
12k
+5V
0.1
µF
47
µF
+5V
VIN
VREF(+)
VDD
VREF(–)
GND
MODE
DB7
DB0
INT
RD
WR
CS
40k
27k
VIN
Figure 12. Telecom A/D Converter



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