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ADC0820 датащи(PDF) 13 Page - NXP Semiconductors |
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ADC0820 датащи(HTML) 13 Page - NXP Semiconductors |
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13 / 14 page ![]() Philips Semiconductors Linear Products Product specification ADC0820 8-Bit, high-speed, µP-compatible A/D converter with track/hold function August 31, 1994 580 therefore not necessary to filter out these transients by putting an external cap on the VIN terminal, if an input amplifier that can settle within 600ns is used to drive the input. The NE530 is a suitable op amp for driving the input of the ADC0820. Inherent Sample-Hold Another benefit of the ADC0820’s input mechanism is its ability to measure a variety of high-speed signals without the help of an external sample-and-hold. In a conventional SAR type converter, regardless of its speed, the input must remain at least 1/2LSB stable throughout the conversion process if full accuracy is to be maintained. Consequently, for many high-speed signals, this signal must be externally sampled, and held stationary during the conversion. Sampled data comparators, by nature of their input switching, already accomplish this function to a large degree (Section 1.2). Although the conversion time for the ADC0820 is 1.5 µs, the time through which VIN must be 1/2LSB stable is much smaller. Since the MS flash ADC uses VIN as its “compare” input and the LS ADC uses VIN as its “zero” input, the ADC0820 only “samples” VIN when WR is Low. Even though the two flashes are not done simultaneously, the analog signal is measured at one instant. The value of VIN approximately 100ns after the rising edge of WR (100ns due to internal logic propagation delay) will be the measured value. Input signals with slew rates typically below 100mV/ µs can be converted without error. However, because of the input time constants, and charge injection through the opened comparator input switches, faster signals may cause errors. Still, the ADC0820’s loss in accuracy for a given increase in signal slope is far less than what would be witnessed in a conventional successive approximation device. An SAR type converter with a conversion time as fast as 1 µs would still not be able to measure a 5V, 1kHz sine wave without the aid of an external sample-and-hold. The ADC0820, with no such help, can typically measure 5V, 7kHz waveforms. +5V 0.1 µF 47µF VREF VIN VDD VDD VIN VREF(+) VREF(–) GND MODE INT RD DB7 DB0 RDY CS Figure 11. 8-Bit Resolution Configuration – + (+4VCC, 3kHz MAX) +5V 25k 12k +5V 0.1 µF 47 µF +5V VIN VREF(+) VDD VREF(–) GND MODE DB7 DB0 INT RD WR CS 40k 27k VIN Figure 12. Telecom A/D Converter |
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