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AC01 датащи(PDF) 24 Page - NXP Semiconductors |
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AC01 датащи(HTML) 24 Page - NXP Semiconductors |
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24 / 24 page ![]() 2000 Oct 20 24 BCcomponents Product specification Cemented wirewound resistors AC01/03/04/05/07/10/15/20 4.23 climatic sequence: 4.23.2 Ba dry heat 16 hours; 200 °C 4.23.3 Db damp heat (accelerated) 1st cycle 24 hours; 55 °C; 95 to 100% RH 4.23.4 Aa cold 2 hours; −40 °C 4.23.5 M low air pressure 1 hour; 8.5 kPa; 15 to 35 °C 4.23.6 Db damp heat (accelerated) remaining cycles 5 days; 55 °C; 95 to 100% RH ∆R/R max.: ±1% + 0.05 Ω 4.24.2 3 (Ca) damp heat (steady state) 56 days; 40 °C; 90 to 95% RH; dissipation ≤0.01 Pn no visible damage ∆R/R max.: ±1% + 0.05 Ω 4.8.4.2 temperature coefficient at 20/ −40/20 °C, 20/200/20 °C: R< 10 Ω TC ≤±600 × 10−6/K R ≥ 10 Ω−80 × 10−6 ≤ TC TC ≤ +140 × 10−6/K temperature rise horizontally mounted, loaded with Pn hot-spot temperature less than maximum body temperature 4.13 short time overload room temperature; dissipation 10 × Pn; 5 s (voltage not more than 1000 V/25 mm) ∆R/R max.: ±2% + 0.1 Ω 4.25.1 endurance (at 40 °C) 1000 hours loaded with Pn; 1.5 hours on and 0.5 hours off no visible damage ∆R/R max.: ±5% + 0.1 Ω 4.25.1 endurance (at 70 °C) 1000 hours loaded with 0.9Pn; 1.5 hours on and 0.5 hours off no visible damage ∆R/R max.: ±5% + 0.1 Ω 4.23.2 27 (Ba) endurance at upper category temperature 1000 hours; 200 °C; no load no visible damage ∆R/R max.: ±5% + 0.1 Ω Other tests in accordance with IEC 60115 clauses and IEC 60 068 test method 4.29 45 (Xa) component solvent resistance 70% 1.1.2 trichlorotrifluoroethane and 30% isopropyl alcohol; H20 no visible damage 4.18 20 (Tb) resistance to soldering heat 10 s; 260 ±5 °C; flux 600 ∆R/R max.: ±0.5% + 0.05 Ω 4.17 20 (Tb) solderability (after ageing) 16 hours steam or 16 hours at 155 °C; 2 ±0.5 s in solder at 235 ±5 °C; flux 600 good tinning ( ≥95% covered); no damage 4.5 tolerance on resistance applied voltage ( ±10%): R − Rnom: ±5% max. R< 10 Ω: 0.1 V 10 Ω≤ R< 100 Ω: 0.3 V 100 Ω≤ R< 1 kΩ: 1 V 1k Ω≤ R< 10 kΩ: 3 V 10 k Ω≤ R ≤ 33 kΩ: 10 V IEC 60115-1 CLAUSE IEC 60068 TEST METHOD TEST PROCEDURE REQUIREMENTS |
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