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HAL501 датащи(PDF) 46 Page - Micronas |
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HAL501 датащи(HTML) 46 Page - Micronas |
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46 / 48 page ![]() HAL 5xy DATA SHEET 46 April 15. 2010; DSH000020_004EN Micronas 5. Application Notes 5.1. Ambient Temperature Due to the internal power dissipation, the temperature on the silicon chip (junction temperature TJ) is higher than the temperature outside the package (ambient temperature TA). Under static conditions and continuous operation, the following equation applies: For all sensors, the junction temperature range TJ is specified. The maximum ambient temperature TAmax can be calculated as: For typical values, use the typical parameters. For worst case calculation, use the max. parameters for IDD and Rth, and the max. value for VDD from the appli- cation. 5.2. Extended Operating Conditions All sensors fulfil the electrical and magnetic character- istics when operated within the Recommended Oper- ating Conditions (see page 14). Supply Voltage Below 3.8 V Typically, the sensors operate with supply voltages above 3 V, however, below 3.8 V some characteristics may be outside the specification. Note: The functionality of the sensor below 3.8 V is not tested on a regular base. For special test conditions, please contact Micronas. 5.3. Start-Up Behavior Due to the active offset compensation, the sensors have an initialization time (enable time ten(O)) after applying the supply voltage. The parameter ten(O) is specified in the Electrical Characteristics (see page 15). During the initialization time, the output state is not defined and the output can toggle. After ten(O), the out- put will be low if the applied magnetic field B is above BON. The output will be high if B is below BOFF. In case of sensors with an inverted switching behavior (HAL 516 ... HAL 519), the output state will be high if B > BOFF and low if B < BON. Note: For magnetic fields between BOFF and BON, the output state of the HAL sensor will be either low or high after applying VDD. In order to achieve a defined output state, the applied magnetic field must be above BON, respectively, below BOFF. 5.4. EMC and ESD For applications with disturbances on the supply line or radiated disturbances, a series resistor and a capacitor are recommended (see Fig. 5–1). The series resistor and the capacitor should be placed as closely as pos- sible to the HAL sensor. Applications with this arrangement passed the EMC tests according to the product standards ISO 7637. Please contact Micronas for the detailed investigation reports with the EMC and ESD results. Fig. 5–1: Test circuit for EMC investigations T J T A ΔT + = ΔTI DD V DD R th × × = T Amax T Jmax ΔT – = RV 220 Ω VEMC VP 4.7 nF VDD OUT GND 1 2 3 RL 1.2 k Ω 20 pF |
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